Tracks of 18·56 MeV/u 40Ar ions in Lexan polycarbonate detector

Abstract

Latent damage tracks of energetic 4°Ar ions (18.56 MeV/u) have been recorded in Lexan polycarbonate detector. Bulk and track-etch parameters are evaluated under successive chemical etching. Our results show a linear correlation between the measured track-etch rate along the track and the corresponding total energy-loss rate and predict a threshold value of 5.0 MeV rag-tcm 2 for track registration. Maximum etchable track lengths of 4°Ar ions as a function of energies have also been measured and compared with three different sets of theoretical ranges.

Etchable track lengths of 3.56 GeV 208Pb in various dielectric solids

“…The mean of deviations between experimental and theoretical ranges obtained from three computer codes HB, RANGE and TRIM was evaluated and found to be 3.0%, 4.2% and 1 1 .l %, respectively. This work has qualitatively supported some earlier findings (Dwivedi, 1991;Dwivedi et al, 1993b;Ghosh et al, 1988Ghosh et al, , 1994Jain et al, 1989Jain et al, , 1991Kocsis et al, 1993;Saxena and Dwivedi, 1990) barring a few cases (Ghosh et al, 1994;Kocsis et al, 1993) that the computer code 'RANGE' may be used to derive fairly reliable values of heavy ion ranges in complex solids. Though the validity of theoretical ranges of heavy ions from computer code 'RANGE' has been tested below 20 MeV/u, the program from Henke and Benton is applicable up to 500 MeV/u.…”