This article reviews in situ x‐ray measurement methods including x‐ray fluorescence (XRF), x‐ray scattering and x‐ray imaging. Three classes of in situ methods are covered: spectroscopy‐based, scattering‐based and imaging approaches. The spectroscopy treatment centers on x‐ray excited analysis of x‐ray fluorescence. The types of in situ characterization relying on x‐ray scattering include: identification and quantification of crystallographic phases present, crystallographic texture (i.e., pole figures; orientation distribution functions, odf), residual stress measurement and crystal defect characterization (x‐ray diffraction topography; rocking curve analysis). X‐ray imaging includes radiography and computed tomography as well as mapping using diffracted or fluorescent signal.