In situX‐ray Measurement Methods

Abstract

This article reviews in situ x‐ray measurement methods including x‐ray fluorescence (XRF), x‐ray scattering and x‐ray imaging. Three classes of in situ methods are covered: spectroscopy‐based, scattering‐based and imaging approaches. The spectroscopy treatment centers on x‐ray excited analysis of x‐ray fluorescence. The types of in situ characterization relying on x‐ray scattering include: identification and quantification of crystallographic phases present, crystallographic texture (i.e., pole figures; orientation distribution functions, odf), residual stress measurement and crystal defect characterization (x‐ray diffraction topography; rocking curve analysis). X‐ray imaging includes radiography and computed tomography as well as mapping using diffracted or fluorescent signal.

Advanced Characterization Techniques for Overcoming Challenges of Perovskite Solar Cell Materials

“…[144] X-ray source can be easily adopted for in situ characterization techniques to monitor the evolution of materials under light illumination, thermal stress, or specific atmospheric conditions such as oxygen or moisture. [145][146][147][148] As with the aforementioned in situ characterization techniques for perovskite material studies, in situ X-ray assisted characterization tools can play complimentary roles to achieve better understanding and development of the material. Frequently utilized in situ X-ray techniques in perovskite research field are as follows: XRD, [149] XPS, [150] XRF, [151] and wide-angle X-ray scattering (WAXS).…”