2020
DOI: 10.1016/j.optcom.2020.126316
|View full text |Cite
|
Sign up to set email alerts
|

Traceable and long-range grating pitch measurement with picometer resolution

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

0
7
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 6 publications
(7 citation statements)
references
References 23 publications
0
7
0
Order By: Relevance
“…d 1 is a constant, and thus, only solving for the phase difference in dual-grating is required. Subsequently, the spacing of the grating to be calibrated can be calculated by Equation (5).…”
Section: Principle Of Dual-grating Homodyne Interferometer Calibrationmentioning
confidence: 99%
See 2 more Smart Citations
“…d 1 is a constant, and thus, only solving for the phase difference in dual-grating is required. Subsequently, the spacing of the grating to be calibrated can be calculated by Equation (5).…”
Section: Principle Of Dual-grating Homodyne Interferometer Calibrationmentioning
confidence: 99%
“…d is a constant, and thus, only solving for the phase difference in dual-grating is required. Subsequently, the spacing of the grating to be calibrated can be calculated by Equation (5). From the above equation, it can be inferred that the accuracy of the spacing measuring system primarily depends on the extraction of the phase difference in dual-grating.…”
Section: Principle Of Dual-grating Homodyne Interferometer Calibrationmentioning
confidence: 99%
See 1 more Smart Citation
“…With the continuous progress in high-end manufacturing, precision measurement technology [1] as well as metamaterials [2][3][4] are being developed more and more rapidly. At present, the commonly used ultra-precision measurement methods include scanning tunneling microscope (STM) [5][6][7], optical fiber displacement sensor [8,9], laser interferometer method [10][11][12][13][14] and grating measurement method [15][16][17][18]. Among them, the laser interferometer method uses the laser wavelength as the measurement standard, which is greatly affected by the humidity, temperature and air pressure changes in the use environment [19].…”
Section: Introductionmentioning
confidence: 99%
“…However, this method is not suitable for the evaluation of the whole length of a scale grating due to the limited measurement throughput. On the other hand, a method utilizing the laser diffraction, in which the period of pattern structure can be evaluated by the angle of diffraction of a diffracted laser beams emanated from the grating surface under evaluation, is a promising one for the evaluation of the whole length of a scale grating [8][9][10][11][12][13]. Although the measurand capable of being evaluated in this method is limited to a mean of the grating period over the area where the measurement laser beam is irradiated (namely, this method is an indirect method for measurement of the pitch of a scale grating), it is suitable for the calibration of large area grating patterns due to its high measurement throughput and non-contact measurement apparatus.…”
Section: Introductionmentioning
confidence: 99%