Towards theoretical analysis of optoelectronic performance of uniform and random metallic nanowire layers

Marus, Mikita; Hubarevich, Aliaksandr; Wang, Hong; Mukha, Yauhen; Smirnov, A.; Huang, Hui; Fan, Weijun; Sun, Xiao Wei

doi:10.1016/j.tsf.2017.02.012

Cited by 6 publications

(6 citation statements)

References 51 publications

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“…ber of the NW crossitigs when the NW film changes from insulator to conductor, Vc is the NW crossings volume and Vue is the unit cell volume. Above mentioned models were proved to be in good agreement with experimental data and successfully applied by our group in previous work [113][114][115][116][117][118]. the diameter of NWs strongly improves the conductivity of TCLs, it also leads to significantly higher haze and thus limits the applications of TCLs on their base [101,152].…”

Section: Synthesis Of Agnwssupporting

confidence: 70%

“…where on is the conductivity of metal, <his the volume fraction of patterned metal layer, t/lcrir is the volume fraction threshold when the conductivity of patterned metal layer is zero, his the thickness of the metal layer and tis the critical exponent. Above mentioned methods were successfully applied by our group in several research articles [113][114][115][116][117][118].…”

Section: Methodology For Comparing Np and Nw Tclsmentioning

confidence: 99%

“…We assumed ideal crossings of NWs for both uniform and random layers. Above mentioned models were successfully applied by our group in [113][114][115][116][117][118].…”

Section: Methodology For Comparing Random and Ordered Nw Tclsmentioning

confidence: 99%

“…A uniform broadband transmittance is observed for wavelengths longer than 400 nm, while decrement due to the localized surface plasmon resonance is in range of 325-400 nm. We have successfully implemented the abovementioned model in series of publications [113][114][115][116][117]. The values of NW radius rand SC were 50 run and 35%, respectively.…”

Section: Vue )Tmentioning

confidence: 99%

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Novel metallic transparent conductive layers for optoelectronics

Marus¹

Self Cite

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for their constant support, guidance and understanding throughout my research work. Thanks to Prof Aliaksandr Smirnov for his suggestions and help before and during my PhD track. I am grateful to Jeremy for his help and time contributed to our project. It has been my pleasure to work with you all and I hope to continue our collaboration in future. I want to thank Dr Aliaksandr Hubarevich for all his help, support, and for being my friend no matter what problems we faced during our time here. I am looking forward to stay in touch and continue to work together on future projects. Thanks to Julia Gusakova for our teatimes, funny and serious talks; you and Aliaks helped me to stay animated and in good mood. I am very grateful to Nanyang Technological University for being my home for the last four years, a place to develop my personality and skills. Special. thanks to the staff of Graduate Programme Office and especially to Christina for your care, you have always had time to listen to my (many) questions and carefully explain. Many thanks to A *STAR for making it all possible. Hard to express how grateful I am to my wife, Arina, for all her help, care, support and love. I know how hard it was for you. Thanks to my parents and my brother for staying in touch and supporting me. I dedicate this thesis to my family, my wife and our son Leon.

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Section: Synthesis Of Agnwssupporting

confidence: 70%

Section: Methodology For Comparing Np and Nw Tclsmentioning

confidence: 99%

“…We assumed ideal crossings of NWs for both uniform and random layers. Above mentioned models were successfully applied by our group in [113][114][115][116][117][118].…”

Section: Methodology For Comparing Random and Ordered Nw Tclsmentioning

confidence: 99%

Section: Vue )Tmentioning

confidence: 99%

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Novel metallic transparent conductive layers for optoelectronics

Marus¹

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“…Recently, a number of analytical models have also been developed to describe properties of random nanowire networks, but none thus far have explained the effect of nanowire orientation on electrical conductivity in full generality [22][23][24][25][26][27][28][29]. Forro et al proposed a model derived assuming high nanowire density, so that potential drop across nanowire networks can be assumed to be linear [25].…”

Section: Introductionmentioning

confidence: 99%

Analytical modeling of orientation effects in random nanowire networks

Jagota

Scheinfeld

2020

Phys. Rev. E

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Films made from random nanowire arrays are an attractive choice for electronics requiring flexible transparent conductive films. However, thus far there has been no unified theory for predicting their electrical conductivity. In particular, the effects of orientation distribution on network conductivity remain poorly understood. We present a simplified analytical model for random nanowire network electrical conductivity that is the first to accurately capture the effects of arbitrary nanowire orientation distributions on conductivity. Our model is an upper bound and converges to the true conductivity as nanowire density grows. The model replaces Monte Carlo sampling with an asymptotically faster computation and in practice can be computed much more quickly than standard computational models. The success of our approximation provides novel theoretical insight into how nanowire orientation affects electrical conductivity, illuminating directions for future research.

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Synthesis of monodispersed plate-shaped silver particles: with high tap-density and low radius-thickness ratio

Li²,

Wan³

et al. 2022

Journal of Materials Research and Technology

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Towards theoretical analysis of optoelectronic performance of uniform and random metallic nanowire layers

Cited by 6 publications

References 51 publications

Novel metallic transparent conductive layers for optoelectronics

Novel metallic transparent conductive layers for optoelectronics

Analytical modeling of orientation effects in random nanowire networks

Synthesis of monodispersed plate-shaped silver particles: with high tap-density and low radius-thickness ratio

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