2022
DOI: 10.3390/nano12193435
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Towards Highly Efficient Cesium Titanium Halide Based Lead-Free Double Perovskites Solar Cell by Optimizing the Interface Layers

Abstract: Lead halide perovskites are the most promising compared to the other recently discovered photovoltaic materials, but despite their enormous potential, these materials are facing some serious concerns regarding lead-based toxicity. Among many lead-free perovskites, the vacancy-ordered double perovskite cesium titanium halide family (Cs2TiX6, X = Cl, Br, I) is very popular and heavily investigated and reported on. The main objective of this study is to design and compare an efficient cesium titanium halide-based… Show more

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Cited by 14 publications
(18 citation statements)
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“…where, J n is the rate of electron current density; J p is the rate of hole current density; G is carrier generation; R is carrier recombination; x is the function of position. Charge transport equations [11] :…”
Section: Computational Techniquementioning
confidence: 99%
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“…where, J n is the rate of electron current density; J p is the rate of hole current density; G is carrier generation; R is carrier recombination; x is the function of position. Charge transport equations [11] :…”
Section: Computational Techniquementioning
confidence: 99%
“…Poisson equation [ 11 ] : d2ϕ()xdx2badbreak=qεoεr()p()xgoodbreak−normaln()xgoodbreak+NDgoodbreak−NAgoodbreak+ρPρn$$\begin{equation}\frac{{{{\mathrm{d}}}^2\phi \left( {\mathrm{x}} \right)}}{{{\mathrm{dx}}^2}} = \frac{{\mathrm{q}}}{{{\epsilon }_{\mathrm{o}}{\epsilon }_{\mathrm{r}}}} \left( {p\left( {\mathrm{x}} \right) - {\mathrm{n}}\left( {\mathrm{x}} \right) + {N}_{\mathrm{D}} - {N}_{\mathrm{A}} + {\rho }_{\mathrm{P}} - {\rho }_n} \right)\end{equation}$$where, ϕ is electrical potential; q is electric charge constant; ε o is absolute dielectric constant; εr${\epsilon }_r$ is relative dielectric constant; ND${N}_D$ is donor doping density; N A is acceptor doping density; ρ P is hole density distribution; ρ n is electron density distribution; p (x) and n (x) are hole and electron density distribution as a function of the thickness (x).…”
Section: Device Configuration and Simulated Conditionsmentioning
confidence: 99%
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