2019
DOI: 10.1109/ted.2019.2901668
|View full text |Cite
|
Sign up to set email alerts
|

Toward Microwave S- and X-Parameter Approaches for the Characterization of Ferroelectrics for Applications in FeFETs and NCFETs

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 8 publications
(1 citation statement)
references
References 36 publications
0
1
0
Order By: Relevance
“…The charge pump used in a good memory needs to meet the driving voltage and driving current and has the smallest possible area and power consumption. The specific design depends on different types of memory [26]. New devices combining ferroelectric materials and semiconductor devices have gradually been applied.…”
Section: Embedded Ferroelectric Memory and Noncontact Icmentioning
confidence: 99%
“…The charge pump used in a good memory needs to meet the driving voltage and driving current and has the smallest possible area and power consumption. The specific design depends on different types of memory [26]. New devices combining ferroelectric materials and semiconductor devices have gradually been applied.…”
Section: Embedded Ferroelectric Memory and Noncontact Icmentioning
confidence: 99%