2006
DOI: 10.1117/12.655482
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Toward DFM: process worthy design and OPC through verification method using MEEF, TF-MEEF, and MTT

Abstract: Design for Manufacturing (DFM) is being widely accepted as one of keywords in cutting edge lithography and OPC technologies. Although DFM seems to stem from designer's intensions to consider manufacturability and ultimately improve the yield, it must be well understood first by lithographers who have the responsibility of reliable printing for a given design on a wafer. Current lithographer's understanding of DFM can be thought of as a process worthy design, and the requirements set forth from this understandi… Show more

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“…The MEEF values for different layers are shown in Table XII. These values are larger than previously reported data from the industry [31]- [33]. This is due to the lack of a well-optimized optical correction recipe that should include SRAF insertion and retargeting.…”
Section: Accounting For Nonunity Meefcontrasting
confidence: 51%
“…The MEEF values for different layers are shown in Table XII. These values are larger than previously reported data from the industry [31]- [33]. This is due to the lack of a well-optimized optical correction recipe that should include SRAF insertion and retargeting.…”
Section: Accounting For Nonunity Meefcontrasting
confidence: 51%