Total-reflection X-ray fluorescence determination of thorium and uranium in the presence of interfering elements in solid geological objects of natural and technogenic origin
Timur F. Akhmetzhanov,
Tatiana Y. Cherkashina,
Alena N. Zhilicheva
et al.
Abstract:The insufficient spectral resolution of the energy-dispersive total-reflection X-ray fluorescence (TXRF) complicates the U and Th Lα lines using for the quantitative determination of low concentrations of these elements in natural solid samples.
This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.
This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.
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