Atomic spectrometry update: review of advances in X-ray fluorescence spectrometry and its special applications

Vanhoof, Christine; Bacon, Jeffrey R.; Fittschen, Ursula E. A.; Vincze, Laszlo

doi:10.1039/d4ja90034k

J. Anal. At. Spectrom.

2024

DOI: 10.1039/d4ja90034k

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Atomic spectrometry update: review of advances in X-ray fluorescence spectrometry and its special applications

Christine Vanhoof,

Jeffrey R. Bacon,

Ursula E. A. Fittschen

et al.

Abstract: This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.

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Atomic spectrometry update: review of advances in X-ray fluorescence spectrometry and its special applications

Abstract: This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.

Cited by 0 publications

References 90 publications

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