Total-Ionizing-Dose Induced Timing Window Violations in CMOS Microcontrollers

System Health Awareness in Total-Ionizing Dose Environments

“…information into the system in a quantitative manner. Often, variables of interest cannot be measured directly, but other variables that correlate with variables of interest can be measured [58], [59] and hence incorporated in the Bayesian network. Though the "White Surface Sense"…”

“…The example system is a path-following robot [65][66] [59] with a sensor array for the path consisting of six optical transmitter-receiver pairs that are aligned in a row as shown Figure 35.…”

“…Only the sensor was exposed to TID, with the goal of modeling the impact of the variability in the six sensors on the system behavior, motivated by previous work showing that sensors and their subcomponents have a large impact on system performance [58], [59]. This robot was chosen as a test vehicle for modeling system radiation response because the robot design is open source, is inexpensive, almost every variable in the system is accessible for measurement, and irradiated parts can be replaced easily.…”

Methods, strategies and application cases for robotic telemanipulation in hazardous environments

“…The performance and behaviour of COTS have also attracted the attention of researchers, due to the great advantages that these provide [10], [159], [160]. In other specific lines of research, multiple investigations also have been conducted on the effects of microcontrollers under radiation [141], [159], [161]- [165]. Other devices have been tested, such as cameras [166], different sensors [167], [168], servo-drives [169], and other components that robots usually use [170].…”

“…It can cause physical damages in the device or component, inducing to a failure when the accumulated TID reaches its tolerance limit [139]. For example, it can create a degradation of microelectronics, leakage currents, changing transistor parameters, and so on [10], [140], [141]. The Total Ionising Dose is the total sum of the accumulating effect, of the dose rate and the total time that a circuit is exposed to radiation [137].…”