Total Ionizing Dose Characterization of 65 nm Flash-Based FPGA

Rezzak, Nadia; Wang, Jih-Jong; Huang, Chang-Kai; Nguyen, Victor; Bakker, Gregory

doi:10.1109/redw.2014.7004606

Cited by 18 publications

(5 citation statements)

References 4 publications

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“…Otherwise, the IMU is considered to have failed. Similarly, the probability of failure can be calculated for other components, such as the power-switching circuit, lithium-ion battery [34], GPS sensor module, vision SoC module, mmWave radar module, and filter DSP hardware [35,36].…”

Section: Modeling Kalman Filter Software Failures Using Dual-graph Er...mentioning

confidence: 99%

Integrating Commercial-Off-The-Shelf Components into Radiation-Hardened Drone Designs for Nuclear-Contaminated Search and Rescue Missions

Earthperson

Diaconeasa

2023

Drones

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This paper conducts a focused probabilistic risk assessment (PRA) on the reliability of commercial off-the-shelf (COTS) drones deployed for surveillance in areas with diverse radiation levels following a nuclear accident. The study employs the event tree/fault tree digraph approach, integrated with the dual-graph error propagation method (DEPM), to model sequences that could lead to loss of mission (LOM) scenarios due to combined hardware–software failures in the drone’s navigation system. The impact of radiation is simulated by a comparison of the total ionizing dose (TID) with the acceptable limit for each component. Errors are then propagated within the electronic hardware and software blocks to determine the navigation system’s reliability in different radiation zones. If the system is deemed unreliable, a strategy is suggested to identify the minimum radiation-hardening requirement for its subcomponents by reverse-engineering from the desired mission success criteria. The findings of this study can aid in the integration of COTS components into radiation-hardened (RAD-HARD) designs, optimizing the balance between cost, performance, and reliability in drone systems for nuclear-contaminated search and rescue missions.

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Section: Modeling Kalman Filter Software Failures Using Dual-graph Er...mentioning

confidence: 99%

Integrating Commercial-Off-The-Shelf Components into Radiation-Hardened Drone Designs for Nuclear-Contaminated Search and Rescue Missions

Earthperson

Diaconeasa

2023

Drones

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“…A flash-based Microsemi Igloo2 FPGA was selected for this, being the first 68nm Flash-based device with integrated SERDES. CERN has positive experiences with this technology in front-end systems and the initial irradiation tests are showing promising results [15].…”

Section: Gbt Optical Link At 48 Gbpsmentioning

confidence: 99%

Secondary particle acquisition system for the CERN beam wire scanners upgrade

Sirvent¹,

Dehning²,

Emery³

et al. 2015

J. Inst.

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The increasing requirements of CERN experiments make essential the upgrade of beam instrumentation in general, and high accuracy beam profile monitors in particular. The CERN Beam Instrumentation Group has been working during the last years on the Wire Scanners upgrade. These systems cross a thin wire through a circulating beam, the resulting secondary particles produced from beam/wire interaction are detected to reconstruct the beam profile. For the new secondary shower acquisition system, it is necessary to perform very low noise measurements with high dynamic range coverage. The aim is to design a system without tuneable parameters and compatible for any beam wire scanner location at the CERN complex. Polycrystalline chemical vapour deposition diamond detectors (pCVD) are proposed as new detectors for this application because of their radiation hardness, fast response and linearity over a high dynamic range. For the detector readout, the acquisition electronics must be designed to exploit the detector capabilities and perform bunch by bunch measurements at 40MHz. This paper describes the design challenges of such a system, analysing different acquisition possibilities from the signal integrity point of view. The proposed system architecture is shown in detail and the development status presented.

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“…The effects of Total Ionizing Dose (TID) in FPGAs have been widely studied in the scientific literature [ 9 , 10 ]. TID effects are typically studied in circuits where for a given particular input, the output is always the same (deterministic logic).…”

Section: Introductionmentioning

confidence: 99%

“…In flash-based FPGAs, the TID effects at device level are focused on the floating gate and CMOS transistors. The floating gate can be affected by three different radiation-induced phenomena which reduce its threshold voltage: holes injected into the floating gate, holes trapped into the oxides and electrons emitted over the polysilicon/oxide barriers [ 9 ]. Regarding the CMOS transistors, it is necessary to distinguish between NMOS and PMOS transistors.…”

Section: Introductionmentioning

confidence: 99%

On the Entropy of Oscillator-Based True Random Number Generators under Ionizing Radiation

Martín

Martín-Holgado

Peris-López

et al. 2018

Entropy

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The effects of ionizing radiation on field-programmable gate arrays (FPGAs) have been investigated in depth during the last decades. The impact of these effects is typically evaluated on implementations which have a deterministic behavior. In this article, two well-known true-random number generators (TRNGs) based on sampling jittery signals have been exposed to a Co-60 radiation source as in the standard tests for space conditions. The effects of the accumulated dose on these TRNGs, an in particular, its repercussion over their randomness quality (e.g., entropy or linear complexity), have been evaluated by using two National Institute of Standards and Technology (NIST) statistical test suites. The obtained results clearly show how the degradation of the statistical properties of these TRNGs increases with the accumulated dose. It is also notable that the deterioration of the TRNG (non-deterministic component) appears before that the degradation of the deterministic elements in the FPGA, which compromises the integrated circuit lifetime.

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Total Ionizing Dose Characterization of 65 nm Flash-Based FPGA

Cited by 18 publications

References 4 publications

Integrating Commercial-Off-The-Shelf Components into Radiation-Hardened Drone Designs for Nuclear-Contaminated Search and Rescue Missions

Integrating Commercial-Off-The-Shelf Components into Radiation-Hardened Drone Designs for Nuclear-Contaminated Search and Rescue Missions

Secondary particle acquisition system for the CERN beam wire scanners upgrade

On the Entropy of Oscillator-Based True Random Number Generators under Ionizing Radiation

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