2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2017
DOI: 10.1109/radecs.2017.8696139
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Total Dose and Single-Event Effects Testing of the Intersil ISL70040SEH Gallium Nitride (GaN) FET Driver

N. W. van Vonno
1
,
H. W. Satterfield
2
,
L. G. Pearce
3
et al.
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