2009 IEEE International Conference on Computer Design 2009
DOI: 10.1109/iccd.2009.5413118
|View full text |Cite
|
Sign up to set email alerts
|

Topology-driven cell layout migration with collinear constraints

Abstract: Abstract-Traditional layout migration focuses on area minimization, thus suffered wire distortion, which caused loss of layout topology. A migrated layout inheriting original topology owns original design intention and predictable property, such as wire length which determines the path delay importantly. This work presents a new rectangular topological layout to preserve layout topology and combine its flexibility of handling wires with traditional scan-line based compaction algorithm for area minimization. Th… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2014
2014
2023
2023

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 8 publications
(2 citation statements)
references
References 11 publications
(13 reference statements)
0
2
0
Order By: Relevance
“…plexity of layout generation is increasing, which demands new techniques for the generation of dense layouts. Previous works with layout migration [3,9] and cell synthesis [4,5,10] do not support layout generation for newer technology nodes bellow 130nm. Celltk [6] supports 90nm but presents a large area overhead compared to standard-cells.…”
Section: Introductionmentioning
confidence: 97%
“…plexity of layout generation is increasing, which demands new techniques for the generation of dense layouts. Previous works with layout migration [3,9] and cell synthesis [4,5,10] do not support layout generation for newer technology nodes bellow 130nm. Celltk [6] supports 90nm but presents a large area overhead compared to standard-cells.…”
Section: Introductionmentioning
confidence: 97%
“…We believe our technique is flexible enough in order to be applied to other problems like compaction of nonstandard cells [8] and migration of digital [3] or analog [2] cells.…”
Section: Introductionmentioning
confidence: 98%