Top‐Down Approach to Study Chemical and Electronic Properties of Perovskite Solar Cells: Sputtered Depth Profiling Versus Tapered Cross‐Sectional Photoelectron Spectroscopies

Das, Chittaranjan; Zia, Waqas; Mortan, Claudiu; Hussain, Navid; Saliba, Michael; Flege, Jan Ingo; Kot, Małgorzata

doi:10.1002/solr.202100298

Cited by 8 publications

(12 citation statements)

References 54 publications

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“…However, we find an enrichment in the bromine content at the junction between the perovskite film and the TiO 2 substrate. This result has also been observed in previous studies by the means of time-of-flight secondary ion mass spectrometry characterization. ,, …”

Section: Results and Discussionsupporting

confidence: 90%

“…This result has also been observed in previous studies by the means of time-of-flight secondary ion mass spectrometry characterization. 22,41,42 The element distribution is remarkably similar inside the perovskite layer irrespective of the chosen crater, thus further corroborating the reproducibility of the sputtering process and the homogeneity in the bulk of the perovskite layer. This finding means that the following PL characterization will probe, for every crater, a chemically homogeneous layer.…”

Section: ■ Results and Discussionsupporting

confidence: 59%

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In-Depth Chemical and Optoelectronic Analysis of Triple-Cation Perovskite Thin Films by Combining XPS Profiling and PL Imaging

Cacovich

Dally

Vidon

et al. 2022

ACS Appl. Mater. Interfaces

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The investigation of chemical and optoelectronic properties of halide perovskite layers and associated interfaces is crucial to harness the full potential of perovskite solar cells. Depth-profiling photoemission spectroscopy is a primary tool to study the chemical properties of halide perovskite layers at different scales from the surface to the bulk. The technique employs ionic argon beam thinning that provides accurate layer thicknesses. However, there is an urgent need to corroborate the reliability of data on chemical properties of halide perovskite thin films to better assess their stability. The present study addresses the question of the Ar+ sputtering thinning on the surface chemical composition and the optoelectronic properties of the triple-cation mixed-halide perovskite by combining X-ray photoemission spectroscopy (XPS) and photoluminescence (PL) spectroscopy. First, XPS profiling is performed by Ar+ beam sputtering on a half-cell: glass/FTO/c-TiO2/perovskite. The resulting profiles show a very homogeneous and reproducible element distribution until near the buried interface; therefore, the layer is considered as quasihomogeneous all over its thickness, and the sputtering process is stable. Second, we evaluated a set of thinned perovskite layers representative of selected steps along the profile by means of PL imaging optical measurements in both steady-state and transient regimes to assess possible perturbation of the optical properties from the surface to bulk. Obtained PL spectra inside the resulting craters show no peak shift nor phase segregation. Accordingly, the transient PL measurements do not reveal any changes of the surface recombination rate in the sputtered areas. This demonstrates that there is no cumulative effect of sputtering nor drastic chemical and optoelectronic modifications, validating the determination of the in-depth composition of the perovskite layer. Combining XPS profiling with PL characterization can be a precise tool to be applied for an extensive study of the multiple layers and mixed organic/inorganic interfaces of photovoltaic devices.

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Section: Results and Discussionsupporting

confidence: 90%

Section: ■ Results and Discussionsupporting

confidence: 59%

In-Depth Chemical and Optoelectronic Analysis of Triple-Cation Perovskite Thin Films by Combining XPS Profiling and PL Imaging

Cacovich

Dally

Vidon

et al. 2022

ACS Appl. Mater. Interfaces

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“…The tapered cross section was prepared in the same way as reported in our previous work. [ 51 ] To create a tapered cross section, we made a crater using a rotary polishing tool which removed the surface layers in a vortex form and allowed to measure on the formed cross section. A soft conical cotton‐polishing head of 2.0 mm and a low rotation speed were used for polishing to avoid heating.…”

Section: Methodsmentioning

confidence: 99%

Band Bending at Hole Transporting Layer‐Perovskite Interfaces in n‐i‐p and in p‐i‐n Architecture

et al. 2022

Self Cite

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“…After the spin coating of the WBG or NBG perovskite thin film 25 , a thin film of Spiro – OMeTAD is spin-coated on absorber layer of each sub cell 30 . Next, a 100 nm Ag back-contact is thermally evaporated on HTM of bottom sub cell 31 . Before the ITO sputtering as rear electrode of top sub cell, a 10 nm buffer layer is thermally evaporated on HTM of semi-transparent top sub cell to protect the HTM layer against sputtering damage 32 .…”

Section: Resultsmentioning

confidence: 99%

Investigation of optical and electrical properties of novel 4T all perovskite tandem solar cell

Moradbeigi

Razaghi

2022

Sci Rep

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In this paper, a combined three-dimensional (3D) optical-electrical simulation of non-pb and flexible four-terminal (4T) all perovskite tandem solar cell (APTSC) is presented. In this structure, polyethylene terephthalate (PET) is used as substrates, while the top sub cell has a $$MAGeI_{3}$$ M A G e I 3 absorber layer and the bottom sub cell has a $$MASnI_{3}$$ M A S n I 3 absorber layer. This structure is used as a reference in this paper and the optical and electrical properties of it are investigated using the finite element method (FEM). It is shown that this structure has a total power conversion efficiency (PCE) of $$24.65\%$$ 24.65 % . Then, the elimination of the buffer layer and the addition of antireflection layer (ARL) strategies, as well as the use of periodic nano-texture patterns, are used to increase the reference structure’s total PCE. A free-buffer layer tandem device is presented to minimize the parasitic absorption. While the total PCE is improved by $$1.14\%$$ 1.14 % in this case, one of the fabrication steps is also eliminated. A plasma-polymer-fluorocarbon (PPFC) coating layer is suggested as ARL on the substrates of both sub cells to reduce reflection loss. With optimized these layers thickness, total PCE is increased by $$12.76\%$$ 12.76 % . Because the PPFC layer is hydrophobic, the top surface of two sub cells in this structure has self-cleaning characteristic. As a result, this device offers long-term moisture resistance. Finally, the best structure in terms of the maximum total PCE is presented by increasing optical path-length utilizing nano-photonic and nano-plasmonic structures. The final structure is offered as a 4T tandem solar cell (TSC) that is environmentally friendly, extremely flexible, and has self-cleaning capability, with a total PCE of $$30.14\%$$ 30.14 % , which is greater than the total PCE of the reference structure by $$22.27\%$$ 22.27 % .

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Top‐Down Approach to Study Chemical and Electronic Properties of Perovskite Solar Cells: Sputtered Depth Profiling Versus Tapered Cross‐Sectional Photoelectron Spectroscopies

Cited by 8 publications

References 54 publications

In-Depth Chemical and Optoelectronic Analysis of Triple-Cation Perovskite Thin Films by Combining XPS Profiling and PL Imaging

In-Depth Chemical and Optoelectronic Analysis of Triple-Cation Perovskite Thin Films by Combining XPS Profiling and PL Imaging

Band Bending at Hole Transporting Layer‐Perovskite Interfaces in n‐i‐p and in p‐i‐n Architecture

Investigation of optical and electrical properties of novel 4T all perovskite tandem solar cell

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