“…Therefore, phase information is not required. We also overcome the low signal-to-noise problem of measuring weak index structures by optically ruling many equally spaced, identical waveguides, forming a grating with a diffraction efficiency that grows as the square of the number of illuminated lines [8]. The measured diffracted field will then be sampled at a spatial frequency of one over the grating period.…”
We demonstrate tapered waveguides written in volume photopolymers using a three-dimensional (3D) direct-write lithography system. Cross sections of the tapered index profiles are measured using an optical diffraction tomography system.
“…Therefore, phase information is not required. We also overcome the low signal-to-noise problem of measuring weak index structures by optically ruling many equally spaced, identical waveguides, forming a grating with a diffraction efficiency that grows as the square of the number of illuminated lines [8]. The measured diffracted field will then be sampled at a spatial frequency of one over the grating period.…”
We demonstrate tapered waveguides written in volume photopolymers using a three-dimensional (3D) direct-write lithography system. Cross sections of the tapered index profiles are measured using an optical diffraction tomography system.
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