1973
DOI: 10.1143/jpsj.35.822
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Time-Resolved Cyclotron Resonance Analysis of Electron-Exciton Interaction in Silicon

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Cited by 19 publications
(2 citation statements)
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“…In a similar way, a microwave TRCR analysis in silicon was done by Ohyama et al 7 The authors measured the changes in microwave amplitude of a resonator+ sample at fixed frequency and variable magnetic field. They could not resolve the real and imaginary parts of conductivity.…”
Section: Comparison With Other Methodsmentioning
confidence: 99%
“…In a similar way, a microwave TRCR analysis in silicon was done by Ohyama et al 7 The authors measured the changes in microwave amplitude of a resonator+ sample at fixed frequency and variable magnetic field. They could not resolve the real and imaginary parts of conductivity.…”
Section: Comparison With Other Methodsmentioning
confidence: 99%
“…In the past, time-resolved CR was carried out in the microsecond range in indirect-gap semiconductors, such as germanium 1 and silicon, 2 and in doped direct-gap semiconductors, such as gallium arsenide. 3 On the other hand, picosecond timeresolved CR has also been demonstrated by using a freeelectron laser system operated at a megahertz repetition rate.…”
Section: Introductionmentioning
confidence: 99%