Time-resolved core level photoemission: surface photovoltage dynamics of the SiO2/Si(100) interface

Widdra, W.; Bröcker, D.; Gießel, Tatjana; Hertel, I. V.; Krüger, Wilfried; Liero, A.; Noack, F.; Petrov, Valentín; Pop, D.; Schmidt, Philipp; Weber, R.; Will, I.; Winter, Bernd

doi:10.1016/j.susc.2003.07.005

Cited by 66 publications

(52 citation statements)

References 16 publications

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“…These results reveal that the surface photovoltage developed on both the n-and p-Si samples does not exhibit any bias or frequency dependence [44]. The responses to photoillumination are instantaneous in the vacuum environment, as expected, and time constants for the surface photovoltage transients are much faster than our experimental capability (b 10 μs) [54][55][56][57][58].…”

Section: Application Of Square-wave (Sqw) Electrical Pulsessupporting

confidence: 76%

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XPS for chemical- and charge-sensitive analyses

Sezen

Süzer

2013

Thin Solid Films

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By recording X-ray photoelectron spectroscopic binding energy shifts, while subjecting samples to a variety of optical and electrical stimuli, information about charge accumulation on materials or surface structures can be obtained. These stimuli included d.c. as well as a.c. electrical and/or optical pulses covering a wide frequency range (10 −3 to 10 6 Hz) for probing charging and/or photovoltage shifts, stemming from impurities, dopants, defects, etc., whether created intentionally or not. The methodology is simple to implement and provides several new dimensions for thin films and materials analyses.

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Section: Application Of Square-wave (Sqw) Electrical Pulsessupporting

confidence: 76%

“…The potentials we calculated are for the bulk, and are modified towards the surfaces in a Coulombic (1/r) fashion [54][55][56][57][58]. In chemist's language, some of the lost electrons are back-transferred to the n-side such that a space-charge region of approximately 100 nm is developed.…”

mentioning

confidence: 99%

XPS for chemical- and charge-sensitive analyses

Sezen

Süzer

2013

Thin Solid Films

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“…Another commonly used approach is a pump-probe setup which utilizes synchronized data acquisition with the pump and probe light pulses. A key advantage of such experiments is the repeatability of the process which allows accumulating signals over multiple repeats and as result moderate duty cycles can be accepted [16].…”

Section: The Hemispherical Electron Analysermentioning

confidence: 99%

A new dynamic-XPS end-station for beamline P04 at PETRA III/DESY

Babenkov

Aristov

Молодцова

et al. 2015

Nuclear Instruments and Methods in Physics Research Section A:

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a b s t r a c tWe report on a new dynamic-XPS end-station for real-time investigations of advanced materials. The end-station is based on a new Argus hemispherical electron spectrometer with high speed detection system. In combination with the high brilliance XUV beamline P04 at PETRA III it provides users at PETRA III a unique tool for fast (down to 0.1 s/spectrum) and detailed investigations compared to existing XPS devices at other beamlines.

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“…It has been quite challenging to measure time-resolved angleresolved PES spectra and time-resolved PES spectra on surface adsorbates with a sub-monolayer coverage. Timeresolved PES experiments using a pump-probe method has been carried out at several SR facilities at UVSOR, 39,46,47) SAGA 43) light source, BESSY [48][49][50] and SOLEIL.…”

Section: Time-resolved Pes In Ms To Ps Time-scalementioning

confidence: 99%

“…Dynamical change during relaxation of the SPV effect has been widely used to examine the performance of the time-resolved photoemission measurement system at synchrotron radiation facilities. 41,[43][44][45][46][48][49][50] Figure 18(a) shows the selected tr-PES spectra of Si 2p core-level of a Si(111)7 Â 7 surface, taken by the pumpprobe method. The pump is a laser pulse of h ¼ 1:55 eV with a repetition rate of 1 kHz and the probes are five SR pulses of h ¼ 252 eV with the pulse interval of 684 ns (SPring-8 D-mode operation).…”

Section: Examples Of Time-resolved Pes Experimentsmentioning

confidence: 99%

Time-Resolved Photoelectron Spectroscopies Using Synchrotron Radiation: Past, Present, and Future

Yamamoto

Matsuda

2013

J. Phys. Soc. Jpn.

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We present a review on a variety of time-resolved photoelectron spectroscopies (PES) using synchrotron radiation, which can reveal dynamical processes in a wide range of time scale from second to sub-femtosecond by taking advantage of time resolution of detectors or light sources or electronic transitions in matter. As a representative example of light source-based time-resolved PES, the newly developed time-resolved PES system at SPring-8 BL07LSU is introduced along with studies of carrier dynamics on a semiconductor surface. In addition, future direction of time-resolved PES furthered by the recent advances of light sources such as x-ray free electron laser will be discussed.

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Time-resolved core level photoemission: surface photovoltage dynamics of the SiO2/Si(100) interface

Cited by 66 publications

References 16 publications

XPS for chemical- and charge-sensitive analyses

XPS for chemical- and charge-sensitive analyses

A new dynamic-XPS end-station for beamline P04 at PETRA III/DESY

Time-Resolved Photoelectron Spectroscopies Using Synchrotron Radiation: Past, Present, and Future

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