1997
DOI: 10.1366/0003702971938759
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Time-of-Flight Mass Spectrometry for Elemental Analysis

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Cited by 80 publications
(80 citation statements)
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“…[137][138][139][140][141] Detailed reviews of the development and analytical performance of TOF-MS combined with ICP ion source have been presented. [142][143][144][145] Attempts to couple TOF-MS to a microwave induced plasma (MIP) for elemental analysis have also been described.…”
Section: An Overview Of Analytical Applications Of Tof-ms Analyzersmentioning
confidence: 99%
“…[137][138][139][140][141] Detailed reviews of the development and analytical performance of TOF-MS combined with ICP ion source have been presented. [142][143][144][145] Attempts to couple TOF-MS to a microwave induced plasma (MIP) for elemental analysis have also been described.…”
Section: An Overview Of Analytical Applications Of Tof-ms Analyzersmentioning
confidence: 99%
“…With the notable exception of ICP-TOFMS, all multi-channel ICP-MS instruments are assumed to provide 100% duty cycle. For ICP-TOFMS, duty cycle is inherently limited [7].…”
Section: Duty Cycle and Scanning Ratesmentioning
confidence: 99%
“…Consequently, a single-channel system cannot ratio consecutive m/z values as precisely as can a multichannel system. For a multichannel system, counting or Poisson statistics limits precision [21] because multiplicative source noise can be overcome through isotope-ratio [7] or internal-standardization techniques. For the comparisons here, noise sources are separated into two categories: 1) noise that is multiplicative in nature and 2) noise dictated by Poisson statistics.…”
Section: Signal Noise and Precisionmentioning
confidence: 99%
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