2010
DOI: 10.1007/s11998-010-9279-9
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Ti substituted nano-crystalline Cu3N thin films

Abstract: Ti:Cu 3 N thin films were deposited on Si(111), quartz, and glass slide substrates by DC magnetron sputtering in molecular nitrogen ambient. The structural properties of Ti:Cu 3 N thin films were studied by X-ray diffraction (XRD) analysis. XRD measurements show diffraction band with peaks close to the (100) and (200) diffraction lines of cubic antiReO 3 structure of Cu 3 N. The Ti:Cu 3 N nano-crystalline size is in the range 22-27 nm. Lattice constant expansion reflects Ti incorporation causing the excess nit… Show more

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Cited by 17 publications
(15 citation statements)
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References 39 publications
(46 reference statements)
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“…Indeed, the interposition of Cu atoms in Cu 3 N has been reported in experiments [2,11], and recently, Zn atoms have been doped into the centres of Cu 3 N cells, resulting in a stoichiometry of Cu 3 NZn 0:231 [14,15]. By contrast, doping Ti atoms in Cu 3 N by cylindrical magnetron sputtering method did not result in insertion into the body centred position of the lattice [32], but rather segregated to the grain boundaries [33,34]. The large formation energy, 1.21 eV per Ti atom, explains such a challenge.…”
Section: Resultsmentioning
confidence: 94%
“…Indeed, the interposition of Cu atoms in Cu 3 N has been reported in experiments [2,11], and recently, Zn atoms have been doped into the centres of Cu 3 N cells, resulting in a stoichiometry of Cu 3 NZn 0:231 [14,15]. By contrast, doping Ti atoms in Cu 3 N by cylindrical magnetron sputtering method did not result in insertion into the body centred position of the lattice [32], but rather segregated to the grain boundaries [33,34]. The large formation energy, 1.21 eV per Ti atom, explains such a challenge.…”
Section: Resultsmentioning
confidence: 94%
“…The evolution of the film lattice constant is due to the variation in nitrogen stoichiometry [24][25][26]. However, there is no information about the position of excess nitrogen in the Cu 3 N unit cell [24].…”
Section: Resultsmentioning
confidence: 99%
“…The refractive index n and the extinction coefficient k as well as the thickness d of polycrystalline nitrided Ti-Cu thin films on thick quartz substrate were studied. They were determined from transmittance data only using PUMA approach and code described by Birgin et al [41] used in our previous work [25,26,31]. Poelman et al [42] have reviewed and tested PUMA approach and shown it to produce excellent estimate of optical constants of thin films.…”
Section: Optical Propertiesmentioning
confidence: 99%
“…By increasing ST, more nanorods growth on the planes leading to increasing the intensity. However, increasing the peaks at 37.52° , 38.30° , 37.54° , 38.01° and 38.08° by increasing Au ST demonstrating that the (111) plane is the preferred crystalline growth direction for Au nanorods [32][33][34][35][36] .…”
Section: Structural Propertiesmentioning
confidence: 99%