2013
DOI: 10.1016/j.snb.2013.04.121
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Threshold voltage drift of FET sensor arrays with different gate insulators

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Cited by 2 publications
(3 citation statements)
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“…Remarkably, our GFET devices exhibit very small thresholdvoltage drifts (below 1 mV per hour, see Figures 2b, 5, and 6), much smaller than the ones observed with silicon devices (about 0.2-1 mV min −1 , see for instance, refs. [4,33,34] ). In addition, the amplitudes of the electronic signals of DNA hybridization are about 100 mV for our GFET arrays, strongly exceeding the typical 3-10 mV amplitudes of silicon FET arrays (see refs.…”
Section: Discussionmentioning
confidence: 99%
“…Remarkably, our GFET devices exhibit very small thresholdvoltage drifts (below 1 mV per hour, see Figures 2b, 5, and 6), much smaller than the ones observed with silicon devices (about 0.2-1 mV min −1 , see for instance, refs. [4,33,34] ). In addition, the amplitudes of the electronic signals of DNA hybridization are about 100 mV for our GFET arrays, strongly exceeding the typical 3-10 mV amplitudes of silicon FET arrays (see refs.…”
Section: Discussionmentioning
confidence: 99%
“…These effects can induce variation of the electrostatic potential at the solid/electrolyte interface by acting on the gate insulator and/or the molecular coating. (iv) Temporal drift of the FET threshold voltage sometimes amounts to the order of mV/min, which for a hybridization duration of 10 min or more can lead to voltage shifts that are comparable to the hybridization signal 20 .…”
Section: Discussionmentioning
confidence: 99%
“…The positive background charge of the PLL coating attracts target DNA and thus allows hybridization duration well below one hour 22 . This point is of particular importance for field effect detection of hybridization, where temporal drift of the FET threshold voltage can make detection of reactions that last several hours challenging 20 .…”
Section: Methodsmentioning
confidence: 99%