2016
DOI: 10.1088/1742-6596/757/1/012005
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Three step deep reactive ion etch for high density trench etching

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Cited by 10 publications
(11 citation statements)
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“…Alternative approaches for sidewall verticality improvement can include cyclic passivation of the sidewalls as known from silicon deep reactive ion etching (Bosch process). In silicon, sidewall angles of 89.7° have been demonstrated for similar etching depths of 130 µm 45 . Such quasi-ideal sidewall angles are obtained by adjusting the etching time to passivation time ratio 46 .…”
Section: Resultsmentioning
confidence: 88%
“…Alternative approaches for sidewall verticality improvement can include cyclic passivation of the sidewalls as known from silicon deep reactive ion etching (Bosch process). In silicon, sidewall angles of 89.7° have been demonstrated for similar etching depths of 130 µm 45 . Such quasi-ideal sidewall angles are obtained by adjusting the etching time to passivation time ratio 46 .…”
Section: Resultsmentioning
confidence: 88%
“…A close-up image of a fabricated silicon spring, is shown in Figure 3a. The DRIE parameters used are based on [6]. A serpentine design was chosen in order to achieve small spring constants given the limited area between the silicon islands.…”
Section: Resultsmentioning
confidence: 99%
“…A three-step DRIE process, capable of achieving nearly vertical sidewalls with a scallop size of 30 nm, was used. 31 The process was based on the use of C 4 F 8 and SF 6 gases and was implemented on a PlasmaPro 100 Estrelas machine (Oxford Instruments). The pattern was etched 12–13 μm deep into the silicon.…”
Section: Methodsmentioning
confidence: 99%
“…The microstructures were fabricated on 4-inch silicon substrates (one side polished, (100), p-type) by standard lithographic patterning followed by a deep reactive-ion etching (DRIE) process to transfer the pattern into bulk silicon. A three-step DRIE process, capable of achieving nearly vertical sidewalls with a scallop size of 30 nm, was used . The process was based on the use of C 4 F 8 and SF 6 gases and was implemented on a PlasmaPro 100 Estrelas machine (Oxford Instruments).…”
Section: Methodsmentioning
confidence: 99%