1994
DOI: 10.1063/1.1144735
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Three-dimensional probe reconstruction for atomic force microscopy

Abstract: Colloidal gold particles are used as hard, spherical imaging targets to assist in the three-dimensional reconstruction of the atomic force probe apex. Probe reconstructions are shown to be accurate to 1 nm resolution and dynamically change as the sample is scanned, emphasizing the utility of colloidal gold particles as in situ calibration standards for image reconstruction of a coadsorbed specimen.

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Cited by 83 publications
(59 citation statements)
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References 27 publications
(16 reference statements)
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“…The apparent particle widths may be larger than 30 nm owing to a convolution of the scanning tip and the particle edges. However, this exaggerated fringe of sharp-edged objects, characteristic of AFM, does not affect the localization of the particle centers (Vasenka et al, 1994).…”
Section: Afm Scanning Of Nerve Terminalsmentioning
confidence: 93%
“…The apparent particle widths may be larger than 30 nm owing to a convolution of the scanning tip and the particle edges. However, this exaggerated fringe of sharp-edged objects, characteristic of AFM, does not affect the localization of the particle centers (Vasenka et al, 1994).…”
Section: Afm Scanning Of Nerve Terminalsmentioning
confidence: 93%
“…All AFM samples were scanned in less than 10% relative humidity, achieved using a humidity chamber (Bioforce Lab, Ames, IA) perfused with dry N2 gas. Contact mode images were obtained on a Nanoscope I11 AFM (Digital Instruments, Santa Barbara, CA), using oxide-etched silicon nitride tips [200 pm, tip radius 10-20 nm as determined using colloidal gold standards (Vesenka et al, 1993a(Vesenka et al, , 1994] at scan speed 0.2 pmls and sampling forces less than 5 nN. Tapping mode images (Zhong et al, 1993) were obtained on a Nanoscope I11 with a multimode AFM, using Nanoprobe silicon tips (125 pm, tip radius 5-10 nm) at scan speed 1 p d s .…”
Section: Methodsmentioning
confidence: 99%
“…With a high resolution TEM Chung et al [157] even succeeded to reveal the crystalline structure of a silicon tip. An alternative which does not require an electron microscope is to image a sharp structure and reconstruct the tip shape from the image [153,158,159]. In this case one relies on a defined structure of the sharp object and the characterization itself might cause damage to the tip.…”
Section: Characterizationmentioning
confidence: 99%