Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability Analysis

Abstract

Efficient utilization of the inherent parallelism of multi-core architectures is a grand challenge in the field of electronic design automation (EDA). One EDA algorithm associated with a high computational cost is automatic test pattern generation (ATPG). We present the ATPG tool TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully chosen mix of various optimization techniques, multi-million-gate industrial circuits are handled without aborts. TIGUAN supports both conventional single-stuck-at faults and sophisticated conditional multiple stuck-at faults which allows to generate patterns for non-standard fault models. We demonstrate how TIGUAN can be combined with conventional structural ATPG to extract full benefit of the intrinsic strengths of both approaches.

Recent advances in SAT-based ATPG: Non-standard fault models, multi constraints and optimization

“…As a more generic approach, in the following we present the conditional multiple-stuck-at fault model (CMS@) defined in [13], and an extension thereof the enhanced conditional multiple-stuck-at fault model (ECMS@) [28]. As a further application demonstrating the potential of SAT-based ATPG, we consider ATPG for interconnect open faults.…”

“…Besides testing of resistive bridges [13], applications include ATPG power-droop testing [32], minimization/maximization of fault affected outputs for stuckat faults, and switching activity minimization for transition faults [28].…”

“…SAT-based ATPG [10]- [13] has been shown to provide a high fault coverage for large industrial circuits. In particular, the powerful learning and implication techniques of modern SAT solvers are well suited to generate tests for hard-todetect faults or determine the redundancy of faults.…”

SAT-based ATPG beyond stuck-at fault testing

“…However, with the development of advanced SAT solvers [29,34,38], SAT-based ATPG has gained increasing attention in recent years [6,7,13]. In particular, it has been shown that SAT-based ATPG is more effective for hard to test faults and for redundancy identification [6,7,13].…”

“…In particular, it has been shown that SAT-based ATPG is more effective for hard to test faults and for redundancy identification [6,7,13]. The strength in redundancy identification particularly qualifies SAT-based ATPG for analyzing fault tolerance properties, which often requires to show that faults cannot be detected [23,24].…”