Depth
bandgap profiles via a [Ga]/([Ga]+[In]) variation in the Cu(In,Ga)Se2 (CIGS) absorber layer have been implemented as a strategy
to enhance the performance of CIGS solar cells. Since the [Ga]/([Ga]+[In])
determines to a large extent the position of the conduction band minimum,
different Ga-profiles lead to different electronic energy levels structures
throughout the CIGS layer. In this paper, from the investigation of
the dependence of the photoluminescence (PL) on excitation power and
temperature, we critically analyze the impact of a notch or a linear
Ga-profile on the CIGS electronic energy levels structure and subsequent
dominant recombination channels. Notwithstanding, two radiative transitions
involving fluctuating potentials were observed for each sample, and
significant differences in the luminescence resulting from the two
Ga-profiles were identified. For the CIGS absorber with a notch Ga-profile,
two tail-impurity radiative transitions involving equivalent donor
clusters and the same deep acceptor level were ascribed to the CIGS/CdS
interface region and to the notch region. The probability of radiative
recombination in these two regions is discussed. For the CIGS absorber
with a linear Ga-profile, two band-impurity radiative transitions
involving an acceptor, with an ionization energy compatible with the V
Cu defect were ascribed to the CIGS/CdS interface
region. Our results show that the dominant acceptor defects are dependent
on the Ga-profile, and they also highlight the complexity of the radiative
and nonradiative recombination channels revealed by the tight control
of the parameters in the experiment.