2017
DOI: 10.1016/j.solener.2017.06.002
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Thin uniform nickel seed layer formation and its impact on Ni-Cu contact adhesion for c-Si solar cell applications

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Cited by 11 publications
(10 citation statements)
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“…The peeling rate was kept constant at 100 mm/min. The average adhesion strength was found to be 2.4 N/mm (Figure f), which indicates better adhesion as compared to the commercial silver metal contact (average peel force strength of 1.5 N/mm) …”
Section: Resultssupporting
confidence: 86%
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“…The peeling rate was kept constant at 100 mm/min. The average adhesion strength was found to be 2.4 N/mm (Figure f), which indicates better adhesion as compared to the commercial silver metal contact (average peel force strength of 1.5 N/mm) …”
Section: Resultssupporting
confidence: 86%
“…The formation of the phase depends on the amount of Ni and Si available for the reactions, the annealing temperature, and the impurities present in the nickel seed layer. Among the intermetallic Ni–Si compounds, NiSi has a resistivity in the range of 5–18 μΩ cm 2 . Differential scanning calorimetric (DSC) analysis was used to estimate the optimal temperature required for nickel silicide (NiSi) phase formation in the Ni seed layer deposited on the n -type Si wafer.…”
Section: Resultsmentioning
confidence: 87%
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