Thin Layers XRD Study Technique on an Example of Cobalt Tetrafluoro Phthalocyanine

Sukhikh, A. S.; Basova, Tamara V.; Gromilov, S. A.

doi:10.12693/aphyspola.130.889

Cited by 5 publications

(5 citation statements)

References 23 publications

(20 reference statements)

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“…For example, β-CrPc has only one diffraction peak (10-1) in the 2θ region from 6.5 to 7.5°, while two peaks azimuthally rotated 90° relative to each other are observed on the 2D GIXD pattern of as-deposited film. This pattern, however, is very similar to 2D GIXD patterns obtained from thin films of α-CoPc, [28] which indicates that the investigated CrPc film crystallizes as an α-polymorph. Therefore, hkl indexes were assigned to the observed diffraction peaks by analogy with α-CoPc.…”

Section: Resultssupporting

confidence: 76%

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X-Ray Diffraction Study of Crystal Structure and Thin Films of Chromium(II) Phthalocyaninate

Sukhikh¹,

Klyamer²,

Basova³

2020

MHC

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Crystal structure of Cr(II) phthalocyaninate (CrPc) was determined by means of single-crystal X-ray diffraction. It was shown that after vacuum sublimation CrPc crystallized as a β-polymorph, which was isostructural to β-polymorphs of other metal phthalocyanines. When deposited onto glass substrate by organic molecular beam deposition, CrPc formed thin films with strong preferred orientation, consisting of α-polymorph. It was shown that both β-CrPc powder and α-CrPc films were unstable in air and transformed to Cr(OH)Pc. X-Ray diffraction (XRD) studies showed that β-CrPc polycrystalline powder after storage in air (relative humidity 20 %) began to exhibit the first signs of degradation already in 1 hour, while the first changes in XRD patterns of α-CrPc films became noticeable only after a few days. Annealing of α-CrPc films at 250 °C in air at a relative humidity of 70 % leads to their faster conversion to Cr(OH)Pc, and the resulting films have a high degree of crystallinity.

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Section: Resultssupporting

confidence: 76%

“…For this purpose, the as-deposited CrPc thin film was studied using a 2D GIXD technique described in more detail in our previous works. [28,29] The 2D GIXD pattern of as-deposited CrPc film is shown in Figure 6a.…”

Section: Resultsmentioning

confidence: 99%

X-Ray Diffraction Study of Crystal Structure and Thin Films of Chromium(II) Phthalocyaninate

Sukhikh¹,

Klyamer²,

Basova³

2020

MHC

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“…The distance from a sample to a CCD detector was 80 mm. 2D GIXD method has already been described by Sukhikh et al [38,39].…”

Section: Characterization Of Thin Filmsmentioning

confidence: 99%

Vanadyl Phthalocyanine Films and Their Hybrid Structures with Pd Nanoparticles: Structure and Sensing Properties

Klyamer

Sukhikh

Николаева

et al. 2020

Sensors

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In this work, thin films of vanadyl phthalocyanines (VOPc and VOPcF4) are studied as active layers for the detection of gaseous ammonia and hydrogen. The effect of F-substituents on the structural features of vanadyl phthalocyanine films and their sensor response toward ammonia (10–50 ppm) and hydrogen (100–500 ppm) is investigated by X-ray diffraction (XRD) and chemiresistive methods, respectively. It is shown that the sensor response of VOPcF4 films to ammonia is 2–3 times higher than that of VOPc films. By contrast, the sensor response to hydrogen is higher in the case of VOPc films. Apart from this, the hybrid structures of vanadyl phthalocyanine films with Pd nanoparticles deposited on their surface by a chemical vapor deposition method are also tested to reveal the effect of Pd nanoparticles on the sensitivity of VOPc films to hydrogen. Deposition of Pd nanoparticles on the surface of VOPc films leads to the noticeable increase of their sensitivity to hydrogen.

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“…The distance from the sample to the CCD detector was 80 mm. This method has already been described [28][29] in more details.…”

Section: Sample Temperature Was Kept At 160k By Oxford Cryosystemsmentioning

confidence: 99%

“…Each diffraction spot is characterized by 2θ position, which corresponds to a certain crystallographic plane and azimuthal angle ϕ (shown in Figure 7 on ZnPc diffraction pattern), which is the angle between the corresponding crystallographic plane and the substrate surface. [28] Since the azimuthal angle ϕ is equal to 0° for the plane of the preferred orientation of crystallites, it means that it is parallel to the substrate surface. Therefore the measured azimuthal position of the individual diffraction spot effectively shows the angle between a corresponding crystallographic plane and a preferred orientation plane.…”

Section: Study Of Znpc and Znpcf 4 Thin Filmsmentioning

confidence: 99%

Influence of Fluorosubstitution on the Structure of Zinc Phthalocyanine Thin Films

Klyamer¹,

Sukhikh²,

Gromilov³

et al. 2018

MHC

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In this work, thin films of tetrafluorosubstituted zinc phthalocyanine (ZnPcF 4) were deposited by organic molecular beam deposition and studied to reveal the effects of F-substituents on the ZnPcF 4 single crystals and thin films structure. A combination of spectral ellipsometry, atomic force microscopy and diffraction techniques has been used to elucidate the structural features and molecular orientation of thin films of ZnPcF 4. Structural features of the films grown by coevaporation of ZnPc and ZnPcF 4 (1:1) were also considered. Both ZnPcF 4 and ZnPc/ZnPcF 4 films have a preferred orientation along (001) plane with inclination angle of molecules relative to the substrate surface equal to 80° and the lower degree of crystallinity compared to the ZnPc film.

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Thin Layers XRD Study Technique on an Example of Cobalt Tetrafluoro Phthalocyanine

Cited by 5 publications

References 23 publications

X-Ray Diffraction Study of Crystal Structure and Thin Films of Chromium(II) Phthalocyaninate

X-Ray Diffraction Study of Crystal Structure and Thin Films of Chromium(II) Phthalocyaninate

Vanadyl Phthalocyanine Films and Their Hybrid Structures with Pd Nanoparticles: Structure and Sensing Properties

Influence of Fluorosubstitution on the Structure of Zinc Phthalocyanine Thin Films

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