1965 Transactions of the Third International Vacuum Congress 1967
DOI: 10.1016/b978-0-08-012126-0.50013-8
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Thin-film hafnium-hafnium oxide capacitors for high temperature operation

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Cited by 3 publications
(3 citation statements)
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“…In this case, the oxide films have been formed in the same way as the TiO., at 12v with high initial forming current, and the electrodes consist of palladium or platinum. It is again true that if larger forming voltages and/or smaller current densities are employed during the anodization process, the rectification becomes less pronounced and nonpolar, thin-film capacitors of tantalum (10) and hafnium (27,28) with high-performance characteristics are obtained.…”
Section: P-n Junction Characteristics--mentioning
confidence: 99%
“…In this case, the oxide films have been formed in the same way as the TiO., at 12v with high initial forming current, and the electrodes consist of palladium or platinum. It is again true that if larger forming voltages and/or smaller current densities are employed during the anodization process, the rectification becomes less pronounced and nonpolar, thin-film capacitors of tantalum (10) and hafnium (27,28) with high-performance characteristics are obtained.…”
Section: P-n Junction Characteristics--mentioning
confidence: 99%
“…For the chemical deposition of Nb205, a low but manageable concentration of a gaseous niobium compound is needed. Reaction [2] goes completely to the right at all temperatures in question. In order to generate a low concentration of gaseous NbClx, very low chlorine concentrations in an inert gas carrier stream would have to be monitored carefully and good, or at least reproducible, contact between chlorine and the niobium source would have to be ensured.…”
Section: Growth Of Nb205 Films In a Flow Systemmentioning
confidence: 94%
“…The reduction in the area occupied by the capacitors in an integrated circuit by using a high permittivity material is a well established problem. Although many mateJ~ials and methods of preparation (1) have been tried, the established insulators SiO2 and SisN4 have yet to be seriously challenged, except for specialized purposes (2).…”
mentioning
confidence: 99%