2020
DOI: 10.3390/app10051734
|View full text |Cite
|
Sign up to set email alerts
|

Thin CdTe Layers Deposited by a Chamberless Inline Process using MOCVD, Simulation and Experiment

Abstract: The deposition of thin Cadmium Telluride (CdTe) layers was performed by a chamberless metalorganic chemical vapour deposition process, and trends in growth rates were compared with computational fluid dynamics numerical modelling. Dimethylcadmium and diisopropyltelluride were used as the reactants, released from a recently developed coating head orientated above the glass substrate (of area 15 × 15 cm 2 ). Depositions were performed in static mode and dynamic mode (i.e., over a moving substrate). The deposited… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2020
2020
2021
2021

Publication Types

Select...
3

Relationship

1
2

Authors

Journals

citations
Cited by 3 publications
(2 citation statements)
references
References 16 publications
(30 reference statements)
0
2
0
Order By: Relevance
“…Some discrepancies can be observed for both grid types within the temperature region from 658 to 688 K. This is mainly because (1) the low temperature region (<668 K) is limited by the reactor kinetics, and the predicted growth rate is very sensitive to the deposition temperature, following an exponential form ∝ exp(−1/T). The differences arising in this region are mainly attributed to the consideration of the overall surface chemical reaction on the substrate [22,23,30]; (2) the high temperature region (>688 K) is mainly controlled by mass transfer, and a fast surface reaction is occurred, with the deposition rate being proportional to T 3/2 ; (3) between the two regions (668 to 688 K), there exists a transition zone where reaction kinetics and mass transfer both affect the deposition process significantly. The joint effect and Coatings 2020, 10, 1198 6 of 16 the consideration of the overall reaction both lead to the discrepancies between simulation results and the experimental data.…”
Section: Computational Grid Resolutionmentioning
confidence: 99%
See 1 more Smart Citation
“…Some discrepancies can be observed for both grid types within the temperature region from 658 to 688 K. This is mainly because (1) the low temperature region (<668 K) is limited by the reactor kinetics, and the predicted growth rate is very sensitive to the deposition temperature, following an exponential form ∝ exp(−1/T). The differences arising in this region are mainly attributed to the consideration of the overall surface chemical reaction on the substrate [22,23,30]; (2) the high temperature region (>688 K) is mainly controlled by mass transfer, and a fast surface reaction is occurred, with the deposition rate being proportional to T 3/2 ; (3) between the two regions (668 to 688 K), there exists a transition zone where reaction kinetics and mass transfer both affect the deposition process significantly. The joint effect and Coatings 2020, 10, 1198 6 of 16 the consideration of the overall reaction both lead to the discrepancies between simulation results and the experimental data.…”
Section: Computational Grid Resolutionmentioning
confidence: 99%
“…Ramadan and Im [16] investigated the film thickness uniformity in a planetary reactor by optimising multiple parameters. Among these commercial reactors, the inline MOCVD reactor has been successfully employed to deposit CdTe thin film by a group of researchers [17][18][19][20][21]; as such, the inline deposition process with a moving substrate is found to be beneficial to thin film uniformity and productivity [22,23]. However, current simulations on the inline process of CdTe growth are mainly conducted in a steady state, while the flow behaviour with the influence of susceptor moving speed still lacks a systematic investigation.…”
Section: Introductionmentioning
confidence: 99%