Thickness of adsorbed polystyrene layers by ellipsometry

Abstract

;.' Y r ( ) .; I --------------------JOURNAL OF RESEARCH of the National Bureau of Standards-A. Physics and Chemistry Vol. 67A, No.5, September-October 1963 Thickness of Adsorbed Polystyrene Layers by Ellipsometry 1, 2Robert R. Stromberg, Elio Passaglia, and Daniel 1. Tutas (Jun e 5, 1963) The ad sorp t ion of pol ysty rc ne Fr om cyc l ohexane b el o\\" the t hcta temperatuI'c on to chrome ferrot!,pe plate was studied by nwans.o f ellipso m etry: (pol ari zation spcc lron1l'tr y ) . In thi s t echnique changes 111 t he state of pol an zatlOn of polarrz ed lI ght ar e nwasured upon r cflect ion from . a film-cove r ed surface . Th e m eas urements wer e carri ed out i n silu a nd permi tted det ermin atIon of t he t hI ckn ess and re Fract i ve index of t he swoll en pol yme r film at t h e soli dsolu tIOn In terface. A co ncentratio n r a nge o f 0.18 to 9.7 mg/ m l was studi ed for polymer wi t h a mo!ec ular we ig h t ?f 76,000 . . T he t hi ck ness o f t h e ad sor bed film in cr eased w i t h in~r eas in g solution co nccntratlOn , r cac hln g a p lateau for m ost of the co nccnt r atio n range studi ed.The average t hi ck ness at this p latt-au was appr-ox im atel y 2 10 A. Th e adsorbed film was highly swollen, con sisting o f about J2 g/ 100 m 1 of poly m er for most of th e con centration ra nge. The amou n t adsor bed was determined to be appl'ox irnatcly 2.25 X 10-4 rng /cm2 at the p lateau . Compan so n of the rad iU S of gyr at Ion of pol ystv r ene in so l ve nL is made Lo the r es ul ts obtain ed .. •

Reversibility of polyester adsorption on glass

“…It is apparent from the discussion and possibilities presented here that much more knowledge is necessary about the conformation of the polymer molecule. The thickness of adsorbed polymer films in situ has been recently investigated using ellipsometry [18]. The system studied was polystyrene of molecular weight 76,000 adsorbed on a chrome-chrome oxide surface from cyclohexane near the theta temperature.…”

Optical properties of thin films on transparent surfaces by ellipsometry; internal reflection for film covered surfaces near the critical angle

“…Similarly, for 112 values slightly lower and slightly higher than n28 (l.4 1485 and l.41600, respectively) tan if; becomes extremely large when the thickness is the quarterwave thickness. Since the sensitivity (which may be defined as the change of if; with thiclmess [3,15]) is the slope of these curves, it will be recognized that n2 va lues hear nZ 8 and thickness values around the quarter-wave thickness give the highest sensitivity. Moreover, the curves for n2 = 1.3786 and 1.41485 and 1.41600 again show the difficulty of constructing a polarizer using films of these critical refractive indexes; the change of tan if; with thickness ncar the proper thickness is almost discontinuous, so that to make a worthwhile polarizer using t.hese effects would be very difficult indeed.…”

“…r 8 ( 1) where tan if! is the ratio of the magnitude of the two coefficients and Ll is the difference in their phases.…”

A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films

“…The ellipsometer is an optical instrument used to study surfaces and their films by reflection of light [3,4] given by Stromberg et al [5] . The calculation from P and A of the thickness of a film of given refractive index (instructions No.…”

“…•o • Schematic diagram of 5 films on a substrate. Refractive Indices of films are U2 to ng, thicknesses of films are dp to cLr.…”