2017
DOI: 10.3390/coatings7010009
|View full text |Cite
|
Sign up to set email alerts
|

Thickness Measurement Methods for Physical Vapor Deposited Aluminum Coatings in Packaging Applications: A Review

Abstract: Abstract:The production of barrier packaging materials, e.g., for food, by physical vapor deposition (PVD) of inorganic coatings such as aluminum on polymer substrates is an established and well understood functionalization technique today. In order to achieve a sufficient barrier against gases, a coating thickness of approximately 40 nm aluminum is necessary. This review provides a holistic overview of relevant methods commonly used in the packaging industry as well as in packaging research for determining th… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
14
0

Year Published

2018
2018
2024
2024

Publication Types

Select...
9
1

Relationship

2
8

Authors

Journals

citations
Cited by 19 publications
(14 citation statements)
references
References 106 publications
0
14
0
Order By: Relevance
“…Based on the stripped-off sample area A, the nominal thickness of the aluminum layer d NOMINAL was calculated using the determined concentration of aluminum c and a bulk value for density (δ lit ) of 2.7 g/cm 3 taken from the literature [22], as shown in Equation 4. The coating weight (cw NOMINAL ) [g/m 2 ] was calculated according to Equation (5) [23].…”
Section: Inductively-coupled Plasma-mass Spectrometry (Icp-ms)mentioning
confidence: 99%
“…Based on the stripped-off sample area A, the nominal thickness of the aluminum layer d NOMINAL was calculated using the determined concentration of aluminum c and a bulk value for density (δ lit ) of 2.7 g/cm 3 taken from the literature [22], as shown in Equation 4. The coating weight (cw NOMINAL ) [g/m 2 ] was calculated according to Equation (5) [23].…”
Section: Inductively-coupled Plasma-mass Spectrometry (Icp-ms)mentioning
confidence: 99%
“…The finger-pairs were fabricated by Electron Beam Evaporation (EBE-Temescal FC-2000, Livermore, CA, USA) of a 10 nm-thick Cr film (adhesion layer) and a 100 nm-thick gold layer, using a conventional lift-off photolithographic technique. The thickness of the metallic film (deposited by the evaporation method) [ 13 ] was accurately monitored through quartz crystal micro balance (QCM) measurements. The coating speeds (0.1 Å/s for the Cr adhesion layer and 3 Å/s for the Au layer) and the actual geometrical constraints were considered in real time during each deposition process.…”
Section: Methodsmentioning
confidence: 99%
“…Spot measurements of the coating thickness can be performed by an operator on the line, using portable coating thickness analyzer (CTA) or on randomly selected samples in a laboratory. Usually, such portable CTAs are based on eddy currents, magnetic induction, or beta scattering [6][7][8].…”
Section: Introductionmentioning
confidence: 99%