2019
DOI: 10.1021/acs.nanolett.9b01772
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Thickness-Dependent Perovskite Octahedral Distortions at Heterointerfaces

Abstract: In this study, we analyze how the octahedral tilts and rotations of thin films of LaNiO3 and LaAlO3 grown on different substrates, determined using synchrotron X-ray diffraction-measured half-integer Bragg peaks, depend upon the total film thickness. We find a striking difference between films grown on SrTiO3 and LaAlO3 substrates which appears to stem not only from the difference in epitaxial strain state but also from the level of continuity at the heterointerface. In particular, the chemically and structura… Show more

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Cited by 34 publications
(29 citation statements)
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“…Finally, at 2 u.c., only the characteristic surface structure is retained; it is this distortion that takes dominance toward the atomic limit. These structures are consistent with what was found from synchrotron X‐ray diffraction …”
supporting
confidence: 91%
See 1 more Smart Citation
“…Finally, at 2 u.c., only the characteristic surface structure is retained; it is this distortion that takes dominance toward the atomic limit. These structures are consistent with what was found from synchrotron X‐ray diffraction …”
supporting
confidence: 91%
“…The full, distorted u.c. of the film and the substrate were taken into account, with the LNO now monoclinic from the strain‐induced symmetry lowering, compared to bulk; the symmetry being the same for all thicknesses . For more details see the Experimental Section and the Supporting Information.…”
mentioning
confidence: 99%
“…Another minor contribution could be due to the rearrangement of the oxygen atoms at the interface, giving rise to a distortion of the interfacial oxygens' octahedra, yielding an enhanced Dzyaloshinskii-Moriya interaction and, thus, a larger weak ferromagnetic component [45,46]. The oxygen octahedral distortion (OOR) is a consequence not only of the strain imposed by the substrate, but also of the discontinuity present at the interface which changes from a 0 a 0 a 0 (in Glazer's notation) in STO to a − a − c + in CMO, similar to what was found in other heterointerfaces [47][48][49][50][51]. Nonetheless, these distortions might be important only in the first two layers close to the interface, as it was reported in Ref.…”
Section: Discussionmentioning
confidence: 63%
“…The SNO-based nanodevices studied here consist of a 150 nm thick SNO film epitaxially grown with a high vacuum sputtering system on (111) pc -oriented LaAlO 3 substrate [5]. This orientation was chosen such as to be able to access Bragg peaks associated with octahedral distortions of the kind (101) [40][41][42]. Two 5 µm-wide electrodes of Pd and Au were fabricated over the film with a lateral gap of 1 − 2 µm using e-beam lithography.…”
Section: A Sample Preparationmentioning
confidence: 99%