2000
DOI: 10.1016/s0040-6090(99)01109-8
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Thickness dependence of the optical properties of sputter deposited Ti oxide films

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Cited by 121 publications
(59 citation statements)
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“…Calculations were also done for n AR = 2.1, which is typical for sputter-deposited TiO 2 films. 71 However, the results were not significantly better than those for n AR = 1.5 and are not further discussed here. 61 who found ΔT sol ≈ 15% together with T lum (τ < τ c ) and T lum (τ > τ c ) being 49.5% and 45%, respectively.…”
Section: A Thin Filmsmentioning
confidence: 71%
“…Calculations were also done for n AR = 2.1, which is typical for sputter-deposited TiO 2 films. 71 However, the results were not significantly better than those for n AR = 1.5 and are not further discussed here. 61 who found ΔT sol ≈ 15% together with T lum (τ < τ c ) and T lum (τ > τ c ) being 49.5% and 45%, respectively.…”
Section: A Thin Filmsmentioning
confidence: 71%
“…Many reports on the effect of size on thin films of various materials have been published. [11][12][13][14][15] However, only few works on the dependence of the properties nickel oxide films on film thickness have been published. 16) Nickel oxide films obtained by sputtering onto glass substrate at 303 and 673 K were analyzed to understand the role of film thickness on the structural and electrical properties of the nickel oxide films.…”
Section: Introductionmentioning
confidence: 99%
“…In the abstract of the paper the authors comment: "more recent 'polaron' spectra in WO 3 films may also be artifacts," with reference to a recent paper of ours. 1 However, this claim was not substantiated in the paper of Scott et al, our measurements on WO 3 were not discussed any further.…”
mentioning
confidence: 74%
“…The method used by us to extract the absorption coefficient uses a well-known approximation 2 with good accuracy when compared to numerical simulation of R and T spectra. 3 2. For as-deposited, unintercalated WO 3 films, the interference fringes observed in R and T measurements are not visible in the absorption coefficient derived from Eq.…”
mentioning
confidence: 99%
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