2018
DOI: 10.1007/978-3-319-75895-4_4
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Thickness and Beyond. Exploiting Spectroscopic Ellipsometry and Atomic Force Nanolithography for the Investigation of Ultrathin Interfaces of Biologic Interest

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Cited by 5 publications
(7 citation statements)
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“…This interface layer allows simulating the negative values in the NIR region. The Au optical constants, which showed good agreement with literature, were obtained by inversion of the spectra of bare substrates [ 65 ], as done in previous papers [ 58 ].…”
Section: Resultssupporting
confidence: 80%
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“…This interface layer allows simulating the negative values in the NIR region. The Au optical constants, which showed good agreement with literature, were obtained by inversion of the spectra of bare substrates [ 65 ], as done in previous papers [ 58 ].…”
Section: Resultssupporting
confidence: 80%
“…As can be observed in Figure 4 , values in the NIR (far from molecular resonances) and values in the near UV are definitely larger for C 6 -ssDNA SAMs deposited in 1 M NaCl buffer with respect to SAMs deposited in 1 mM NaCl buffer. According to previous reports [ 45 , 58 ], these features are associated to the film optical thickness, a quantity depending on refractive index and thickness, that is higher for 1 M NaCl C 6 -ssDNA samples.…”
Section: Resultsmentioning
confidence: 82%
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“… 30 , 31 To the best of our knowledge, there are no studies on the influence of crosslinking on the swelling/collapsing behavior of PNIPAM brushes, partly as determining the accurate brush heights in the solution is challenging. 32 , 33 It should be noted that the degree of swelling is expected to depend on the geometry and orientation of the chains. For instance, in a brush on a planar surface (compared to a gel in 3D), there is only one spatial dimension available for expansion.…”
Section: Introductionmentioning
confidence: 99%
“…Va inoltre osservato che i valori di | δΔ | nel NIR (lontano dalle risonanze molecolari) e i valori δΨ nel vicino UV sono decisamente maggiori per i SAM depositati ad elevata forza ionica. Come discusso in precedenti lavori [30,41], queste caratteristiche sono associate allo spessore ottico del film, una grandezza correlata all'indice di rifrazione e allo spessore del film, che risulta più elevata per i SAM depositati ad elevata forza ionica. I dati SE confermano quindi che la forza ionica del buffer gioca un ruolo significativo nella formazione del SAM.…”
Section: Fig 3 Esperimenti DI Shaving Su Sam Di Dna Preparati a Bassaunclassified