Thick-film resistor quality indicator based on noise index measurements

Jevtic, M.M.; Mrak, I.; Stanimirovic, Z.

doi:10.1016/s0026-2692(99)00050-6

Cited by 17 publications

(4 citation statements)

References 18 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The values of parameters C int and/or C bulk contribute to the noise index of a resistor-an important parameter for its applications and a valuable indicator of its reliability, long-term drift and lifetime [35] and an efficient tool in failure prediction of electron devices and circuits [36][37][38].…”

Section: Discussionmentioning

confidence: 99%

Noise properties of Pb/Cd-free thick film resistors

Stadler

Kolek

Zawiślak

et al. 2010

J. Phys. D: Appl. Phys.

View full text Add to dashboard Cite

Abstract. Low-frequency noise spectroscopy has been used to examine noise properties of Pb/Cd-free RuO 2 -and CaRuO 3 -based thick films screen printed on alumina substrates. Experiments were performed in temperature range 77 -300 K and frequency range 0.5 -5000 Hz with multiterminal devices. The measured noise has been recognized as resistance noise that consists of background 1/f noise and components generated by several thermally activated noise sources of different activation energies. The total noise has been composed of the contributions generated in resistive layer and in resistive/conductive layers interface. These noise sources are non-uniformly distributed in the resistor volume. Noise intensity of newresistive layers has been described by noise parameter, C bulk . Pb/Cd-free layers occurred to be noisier than their Pb-containing counterparts, however the remove of Pb and Cd from resistive composition is hardly responsible for the increase of the noise. In case of RuO 2 layers noise increases most likely due to larger grain size of RuO 2 powder used to prepare resistive pastes. The information about the quality of resistive-to-conductive layers interface occurred to be stored in the values of noise parameter C int . Pb/Cd-free RuO 2 -based resistive pastes form wellbehaved interfaces with various Ag-based conductive pastes. On the contrary, CaRuO 3 -based paste forms bad contacts with AgPd terminations because density of TANSs increases in the interface area.

show abstract

Section: Discussionmentioning

confidence: 99%

Noise properties of Pb/Cd-free thick film resistors

Stadler

Kolek

Zawiślak

et al. 2010

J. Phys. D: Appl. Phys.

View full text Add to dashboard Cite

show abstract

“…Results presented in this chapter can be viewed as an experimental verification of correlation between resistance, gauge factor and low-frequency noise parameters (noise index and current noise spectra) and changes with resistor degradation due to the impact of these three types of straining. Furthermore, they can be seen as validation of earlier presumptions [24,25] that standard resistance, noise spectrum and noise index measurements are valuable tools in reliability evaluation of thick resistive films.…”

Section: Resultsmentioning

confidence: 78%

Low‐Frequency Noise and Resistance as Reliability Indicators of Mechanically and Electrically Strained Thick‐Film Resistors

Stanimirovic¹

2017

System Reliability

View full text Add to dashboard Cite

New contemporary applications of thick resistive films are inducing the need to investigate their behaviour under various stressing conditions. On the other hand, there is a growing interest in noise measurements as means of thick-film resistor quality and reliability evaluation and evaluation of degradation under stress. For these reasons, this chapter presents effects of mechanical, electrical and simultaneous mechanical and electrical straining on performances of conventional thick-film resistors that are analysed from micro-and macro-structural, charge transport and low-frequency noise aspects.

show abstract

“…The noise characterization of passive electronic components is getting more and more popular as it is much more sensitive to internal imperfections of materials or components than any other electrical test [5][6][7][8][9]. This technique can be also the source of important knowledge concerning stability and reliability of electronic components [10][11][12][13] indicating possible directions in technology improvement and development.…”

Section: Introductionmentioning

confidence: 99%

Noise Properties Of Thick-Film Conducting Lines For Integrated Inductors

Stadler¹,

Kolek²,

Mleczko³

et al. 2015

Metrology and Measurement Systems

View full text Add to dashboard Cite

Studies of noise properties of thick-film conducting lines from Au or PdAg conductive pastes on LTCC or alumina substrates are reported. Experiments have been carried out at the room temperature on samples prepared in the form of meanders by traditional screen-printing or laser-shaping technique. Due to a low resistance of the devices under test (DUTs), low-frequency noise spectra have been measured for the dc-biased samples arranged in a bridge configuration, transformer-coupled to a low-noise amplifier. The detailed analysis of noise sources in the signal path and its transfer function, including the transformer, has been carried out, and a procedure for measurement setup self-calibration has been described. The 1/f noise component originating from resistance fluctuations has been found to be dominant in all DUTs. The analysis of experimental data leads to the conclusion that noise is produced in the bends of meanders rather than in their straight segments. It occurs that noise of Au-based laser-shaped lines is significantly smaller than screen-printed ones. PdAg lines have been found more resistive but simultaneously less noisy than Au-based lines.

show abstract

Thick-film resistor quality indicator based on noise index measurements

Cited by 17 publications

References 18 publications

Noise properties of Pb/Cd-free thick film resistors

Noise properties of Pb/Cd-free thick film resistors

Low‐Frequency Noise and Resistance as Reliability Indicators of Mechanically and Electrically Strained Thick‐Film Resistors

Noise Properties Of Thick-Film Conducting Lines For Integrated Inductors

Contact Info

Product

Resources

About