2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) 2021
DOI: 10.1109/mwscas47672.2021.9531747
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Thermo-mechanical Analysis and Fatigue Life Prediction for Integrated Circuits (ICs)

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Cited by 8 publications
(2 citation statements)
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“…However, the thermal conductivity of this layer is often disregarded due to its narrowness and the focus on its electrical conductance within the bonding lane [35,36]. However, the junction layer, despite its narrowness, possesses significant heat conductivity [37,38], making it one of the crucial factors affecting heat distribution. Table 2 lists the parameters used in the model.…”
Section: Heat Analysis Of Sips Based On Cclcmentioning
confidence: 99%
“…However, the thermal conductivity of this layer is often disregarded due to its narrowness and the focus on its electrical conductance within the bonding lane [35,36]. However, the junction layer, despite its narrowness, possesses significant heat conductivity [37,38], making it one of the crucial factors affecting heat distribution. Table 2 lists the parameters used in the model.…”
Section: Heat Analysis Of Sips Based On Cclcmentioning
confidence: 99%
“…Due to the evolution of integration technologies with their ever-increasing power densities and clock frequencies, the performance, lifetime, and reliability of systems-on-chips (SoCs) have become more severely constrained by thermal issues than ever before. Failure mechanisms such as electromigration and thermomechanical stress, notably caused by the increased leakage power consumption [1][2][3], can increase the cooling cost and give rise to timing failures due to interconnect delays [4][5][6][7]. To tackle the thermal challenges associated with SoC implementation, designers commonly use thermal-aware floorplanning techniques to reduce thermal peaks and equally distribute temperature across a die.…”
Section: Introductionmentioning
confidence: 99%