2013
DOI: 10.1103/physrevb.87.125110
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Thermally activated recovery of electrical conductivity inLaAlO3/SrTiO3

Abstract: Patterned structures of LaAlO3/SrTiO3 that exhibit a decrease in their electrical conductivity below 30 K, recover their higher conductivity upon warming in a thermally activated process. Two dominant energy barriers E b are identified: E b1 = 0.224 ± 0.003 eV related to conductivity recovery near 70 K and E b2 = 0.44 ± 0.015 eV related to conductivity recovery near 160 K. We discuss possible linkage to structural defects such as dislocations and twin boundaries. PACS numbers:An attractive feature of the inter… Show more

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Cited by 24 publications
(22 citation statements)
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“…The same de-trapping behaviour has also been reported in LaAlO 3 /SrTiO 3 30 at similar temperatures. The authors associated this behaviour to a thermally activated mechanism supported by exponential relaxations of conductivity near 70 K and 160 K. However, this behaviour should not be confused with the low-temperature logarithmic relaxations observed after a gate voltage step that we described in the present article.…”
Section: Model and Discussionsupporting
confidence: 85%
“…The same de-trapping behaviour has also been reported in LaAlO 3 /SrTiO 3 30 at similar temperatures. The authors associated this behaviour to a thermally activated mechanism supported by exponential relaxations of conductivity near 70 K and 160 K. However, this behaviour should not be confused with the low-temperature logarithmic relaxations observed after a gate voltage step that we described in the present article.…”
Section: Model and Discussionsupporting
confidence: 85%
“…This phenomenon occurs below ~40 K in connection with driving an electrical current through the sample exceeding a certain threshold. The initial as-cooled Rs recovers upon warming, particularly around 70 and 160 K, similar to the behavior exhibited by LAO/STO system [18,19] . To probe the microscopic manifestation of the effect we have used a scanning 3 superconducting quantum interference device (SQUID) and observed spatial changes in magnetic flux pattern prior to and after the Rs increase.…”
supporting
confidence: 66%
“…Data for sample II (not shown) are very similar. At 300 K n tot amounts to about 4×10 13 cm -2 and drops down to ≈ 2.5 ×10 13 cm -2 for T ≤ 10 K. The Tdependence of n tot is typical for 2DES in STO based heterostructures [26] and is usually interpreted as a freeze-out of charge carriers [33,34]. The Hall mobility of n hi was calculated by µ = (R s (B = 0)×n hi ×e) -1 , where e is the elementary charge.…”
Section: A Temperature Dependence Of the Electronic Transportmentioning
confidence: 99%