2006
DOI: 10.1088/0960-1317/16/11/036
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Thermal stress analyses of multilayered films on substrates and cantilever beams for micro sensors and actuators

Abstract: Thermal stress-induced damage in multilayered films formed on substrates and cantilever beams is a major reliability issue for the fabrication and application of micro sensors and actuators. Using closed-form predictive solutions for thermal stresses in multilayered systems, specific results are calculated for the thermal stresses in PZT/Pt/Ti/SiO2/Si3N4/SiO2 film layers on Si substrates and PZT/Pt/Ti/SiO2 film layers on Si3N4 cantilever beams. When the thickness of the film layer is negligible compared to the… Show more

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Cited by 38 publications
(33 citation statements)
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References 22 publications
(34 reference statements)
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“…Before investigation commenced for this study, our software was tested using some multilayer systems like PZT/Ti/SiO2. Satisfactory results in agreement with the results of other investigators 19,20) were obtained. In the present study, 108 FEA models were constructed.…”
Section: Finite Element Formulation and Analysis Of Multilayer Structsupporting
confidence: 92%
“…Before investigation commenced for this study, our software was tested using some multilayer systems like PZT/Ti/SiO2. Satisfactory results in agreement with the results of other investigators 19,20) were obtained. In the present study, 108 FEA models were constructed.…”
Section: Finite Element Formulation and Analysis Of Multilayer Structsupporting
confidence: 92%
“…To achieve good thermal isolation from the surrounding substrate, suspended membranes were also introduced into these anemometers. However, these suspended membranes are prone to have a deformation due to the thermal stress induced by temperature changes [4], which could result in an uniformity of the temperature distribution on the chip surface. Besides, in the random vibration or high-g shock conditions, the sensors placed on the suspended membranes are much easier to get fractured than those fabricated on the thick substrate [5].…”
Section: Introductionmentioning
confidence: 99%
“…This fabrication process can minimize the heat loss effectively. However, the suspended membranes or cantilevers are susceptible to thermal stress caused by temperature changes [6], resulting in a deformation which could affect the uniformity of the temperature distribution on the chip surface. Moreover, in the vibration or shock environments, the sensors based on the suspended membranes or cantilevers are more prone to get fractured compared with those fabricated on the substrate directly [7].…”
Section: Introductionmentioning
confidence: 99%