2007
DOI: 10.1002/pssa.200673961
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Thermal properties of high power laser bars investigated by spatially resolved thermoreflectance spectroscopy

Abstract: In this work we present results of the analysis of thermal properties of high-power laser bars obtained by spatially resolved thermoreflectance (TR) spectroscopy.Thermoreflectance is a modulation technique relying on periodic facet temperature modulation induced by pulsed current supply of the laser. The periodic temperature change of the laser induces variation of the refractive index and consequently modulates probe beam reflectivity. The technique has a spatial resolution of about ~1 µm and can be used for … Show more

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Cited by 9 publications
(7 citation statements)
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“…The high speed of the reflectance modulation technique allowed to take temperature maps at facets [28,71,117,119,120,[123][124][125][126][127][128]. Furthermore, it became possible to monitor even fairly extended devices such as high power diode laser bars, often called 'cm-bars' (because of the total array width of one cm) [126][127][128]. 431 Bugajski et al [125] have used this technique for analyzing different mounting arrangements via an advanced determination of thermal resistances and for the assessment of different etching technologies.…”
Section: Reflectance Modulation and Thermoreflectancementioning
confidence: 99%
“…The high speed of the reflectance modulation technique allowed to take temperature maps at facets [28,71,117,119,120,[123][124][125][126][127][128]. Furthermore, it became possible to monitor even fairly extended devices such as high power diode laser bars, often called 'cm-bars' (because of the total array width of one cm) [126][127][128]. 431 Bugajski et al [125] have used this technique for analyzing different mounting arrangements via an advanced determination of thermal resistances and for the assessment of different etching technologies.…”
Section: Reflectance Modulation and Thermoreflectancementioning
confidence: 99%
“…Therefore, κ needs to be determined experimentally in case of each device. The following values of thermoreflectance coefficients were obtained as a result of the calibration procedure: 1.54 x 10 5 K for GaAs and average value of 1.96x10 5 K for AR layers [12]. A scheme of the thermoreflectance set-up is presented in the Fig.2.…”
Section: Thermoreflectance Spectroscopy Techniquementioning
confidence: 99%
“…han 1 K. The[12,14] and V[13].Downloaded From: http://proceedings.spiedigitallibrary.org/ on 06/21/2016 Terms of Use: http://spiedigitallibrary.org/ss/TermsOfUse.aspx…”
mentioning
confidence: 98%
“…Therefore, κ needs to be determined experimentally in case of each device. The following values of thermoreflectance coefficients were obtained as a result of the calibration procedure: 1.54 x 10 5 K for GaAs and average value of 1.96x10 5 K for AR layers [20]. A scheme of the thermoreflectance set-up is presented in Fig.…”
Section: Thermoreflectance Spectroscopy Techniquementioning
confidence: 99%