Abstract:In this study, we used simulation technique to analyze the thermal behaviors and investigate the thermal issues of a designed system in package (SiP) for network system application that based on a three dimensional integrated circuit (3D IC) structure. The 3D IC SiP has an interposer which with regularly embedded through-silicon vias (TSVs); there are one CPU chip and two DRAM chips planted on the top side and bottom side of the interposer, respectively. The interposer with chips is bonded on a BT substrate; t… Show more
“…The largest error of the empirical equations is less than 15%. Most simulation data agree with the equivalent equations to an error of less than 10% [12,16].…”
Section: Fig6 Schematic Diagram Of a Tsv Cellmentioning
confidence: 52%
“…To convert the detailed model to the equivalent model, we use a conversion rule that is described in previous literatures [12,16]. In the conversion, the arrays of TSV, solder bump, Fig.…”
Section: (2) Thermal Characteristic Of the 3d Ic Integration Modulementioning
In this investigation, the thermal and mechanical design and analysis of a TSV (through-silicon via) interposer which supports 2 active chips on its top-side and 1 active chip on its bottom-side (a real 3D IC integration with an interposer) are studied. Emphasis is placed on the thermal design and analysis of the chips' average temperatures and the applied cooling capability on the heat spreader/sink. To simplify the simulations, an equivalent model, that can preciously determine the thermal performances of TSVs and solder bumps/balls, is introduced instead of a complicate detail 3D model. Another emphasis is placed on the determination of the creep strain energy density per cycle of the solder bumps/balls between the chips and the TSV interposer, the TSV interposer and the organic package substrate, and the package substrate and the PCB (printed circuit board) under environmental thermal cycling condition.
“…The largest error of the empirical equations is less than 15%. Most simulation data agree with the equivalent equations to an error of less than 10% [12,16].…”
Section: Fig6 Schematic Diagram Of a Tsv Cellmentioning
confidence: 52%
“…To convert the detailed model to the equivalent model, we use a conversion rule that is described in previous literatures [12,16]. In the conversion, the arrays of TSV, solder bump, Fig.…”
Section: (2) Thermal Characteristic Of the 3d Ic Integration Modulementioning
In this investigation, the thermal and mechanical design and analysis of a TSV (through-silicon via) interposer which supports 2 active chips on its top-side and 1 active chip on its bottom-side (a real 3D IC integration with an interposer) are studied. Emphasis is placed on the thermal design and analysis of the chips' average temperatures and the applied cooling capability on the heat spreader/sink. To simplify the simulations, an equivalent model, that can preciously determine the thermal performances of TSVs and solder bumps/balls, is introduced instead of a complicate detail 3D model. Another emphasis is placed on the determination of the creep strain energy density per cycle of the solder bumps/balls between the chips and the TSV interposer, the TSV interposer and the organic package substrate, and the package substrate and the PCB (printed circuit board) under environmental thermal cycling condition.
“…It can be seen that an interposer with TSVs is supporting a high-performance chip on its top side and another chip on its bottom-side. These chips are arranged into a face-to-face situation so as to achieve better electrical performance [21][22][23][24].…”
In this study, 3D IC integrations with a TSV interposer supporting Moore's law chips on its top and bottom sides are investigated. Emphasis is placed on the determination of the TSV interposer warpage and the nonlinear stress and creep strain in the Cu-Iow-k pads and micro solder joints.
“…Feng et al [23] proposed an equivalent thermal model for 2.5D packages, and the calculation time was reduced from 15 min to 23 s. Lau et al [24] also investigated the thermal performance of three-layer-stacked chips using the computational fluid dynamics analysis method, and the empirical formula of effective thermal conductivity was proposed. Heng [25] proposed an equivalent model considering TSV, bump, and metallic trace, which could effectively improve the calculation efficiency of 3D system in package (SiP). Chen et al [26] established an equivalent thermal resistance model for TSV, and the thermal performance of a 3D stacked-die package with TSV was quickly estimated by the proposed model.…”
An accurate equivalent thermal model is proposed to calculate the equivalent thermal conductivity (ETC) of shield differential through-silicon via (SDTSV). The mathematical expressions of ETC in both horizontal and vertical directions are deduced by considering the anisotropy of SDTSV. The accuracy of the proposed model is verified by the finite element method (FEM), and the average errors of temperature along the X-axis, Y-axis, diagonal line, and vertical directions are 1.37%, 3.42%, 1.76%, and 0.40%, respectively. Compared with COMSOL, the proposed model greatly improves the computational efficiency. Moreover, the effects of different parameters on the thermal distribution of SDTSV are also investigated. The thermal conductivity is decreased with the increase in thickness of SiO2. With the increase in pitch, the maximum temperature of SDTSV increases very slowly when β = 0°, and decreases very slowly when β = 90°. The proposed model can be used to accurately and quickly describe the thermal distribution of SDTSV, which has a great prospect in the design of 3D IC.
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