2014
DOI: 10.1063/1.4896979
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Thermal desorption spectroscopy from the surfaces of metal-oxide-semiconductor nanostructures

Abstract: An experimental setup, which combines direct heating and temperature measurement of metal nanofilms allowing temperature programmed desorption experiments is described. This setup enables the simultaneous monitoring of the thermal desorption flux from the surface of chemi-electric devices and detection of chemically induced hot charge carriers under UHV conditions. This method is demonstrated for the case of water desorption from a Pt/SiO2-n-Si metal-oxide-semiconductor nanostructure.

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Cited by 8 publications
(3 citation statements)
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“…Optical measurements are hampered by the fact that such thin metal films are optically partially transparent. Indirect ways to measure this temperature have been explored, 82,83 but they must not conflict with recording the chemicurrent.…”
Section: Discussionmentioning
confidence: 99%
“…Optical measurements are hampered by the fact that such thin metal films are optically partially transparent. Indirect ways to measure this temperature have been explored, 82,83 but they must not conflict with recording the chemicurrent.…”
Section: Discussionmentioning
confidence: 99%
“…Surfaces treatment of metals can be carried out by different conventional methods namely, physical, chemical, mechanical, physicochemical and chemi-thermal methods [12]. In mechanical treatment, contamination removal is achieved by mechanical wiping, scraping, milling, exposure to air or water jet, physical treatment mechanism consists in dissolution of contaminants with the help of various solvents and in their subsequent removal from the work-piece surface [13,14], Intensification of the treatment process is achieved by placing of ultrasonic vibration into the treatment area [15], physicochemical treatment consist in dissolution, emulsification and chemical destruction of contaminations, chemi-thermal method consists in chemical destruction of contaminations in flame or in alkaline melt at high temperatures (400-450 o C) and mechanical treatment efficiency can be improved by optimization of alkaline melt composition and process automation [16,17].…”
Section: Importance Of Plasma Treatment Of Surfacesmentioning
confidence: 99%
“…[13][14][15][16][17] An etched wafer sample was placed in an evacuated reactor, and XeF 2 gas was introduced to the reactor for 30 s while the pressure was gradually increased to about 133 Pa. During this procedure, the sidewall with a thin film with poor etch tolerance could be etched by F atoms. Thermal desorption spectroscopy (TDS) 18,19) was also carried out on etched samples to evaluate the amount of F-and Br-containing species in the sidewall film deposited during etching.…”
mentioning
confidence: 99%