Thermal degradation analysis of deuterium-ion-implanted V25Cr40Ti35 using synchrotron radiation photoelectron spectroscopy

Abstract

The thermal degradation of a native oxide layer on the hydrogen storage alloy V 25 Cr 40 Ti 35 and the thermal desorption property of deuterium molecules were studied by synchrotron radiation soft X-ray photoelectron spectroscopy and thermal desorption mass spectrometry. Photoelectron spectra of O-1s, C-1s, V-2p, Cr-2p, and Ti-2p were observed for an as-received sample and a deuterium-ion-implanted one. Although the oxide layer changed dramatically by thermal annealing between 373 K and 473 K for the un-implanted sample, the change of the deuterium-ion-implanted sample was lying between 473 K and 573 K corresponding to D 2 desorption. The implantation of deuterium resulted in the stabilization of the surface oxide layer by approximately 100 deg.

Effect of the Soft X-rays on Highly Hydrogenated Diamond-Like Carbon Films

“…14,15) Gas desorbed from the samples was identified using a quadruple mass spectrometer equipped with a differential pumping system. The temperatures ranged from 373 to 1073 K in 8 min.…”

“…A thermal desorption spectroscopy (TDS) apparatus at BL23SU of SPring-8 was used to measure the desorption spectra of H 2 in the H-DLC film. 14,15) Gas desorbed from the samples was identified using a quadruple mass spectrometer equipped with a differential pumping system. The temperatures ranged from 373 to 1073 K in 8 min.…”