2012
DOI: 10.1039/c2cp22901c
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Thermal behavior of MOCVD-grown Cu-clusters on ZnO(101̄0)

Abstract: Scanning tunnelling microscopy (STM) and X-ray photoelectron spectroscopy (XPS, AES) were used to study MOCVD of Cu-clusters on the mixed terminated ZnO(1010) surface in comparison to MBE Cu-deposition. Both deposition methods result in the same Cu cluster morphology. After annealing to 670 K the amount of Cu visible above the oxide surface is found to decrease substantially, indicating a substantial diffusion of Cu atoms inside the ZnO-bulk. The spectroscopic data do not show any evidence for changes in the C… Show more

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Cited by 14 publications
(34 citation statements)
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“…Therefore, as a first step to better understand the complex behavior of the Cu/ZnO system, the interaction of Cu with low‐indexed surfaces of ZnO single crystals as a well‐defined model system was investigated with a broad spectrum of surface science tools. For the polar ZnO surfaces 5–9 and the non‐polar surfaces 10, 11 Cu‐cluster formation is found with the appearance of 3D‐clusters already in the sub‐monolayer range. The structural and the chemical state at the cluster/oxide interface on the other hand are quite unclear.…”
Section: Introductionmentioning
confidence: 94%
“…Therefore, as a first step to better understand the complex behavior of the Cu/ZnO system, the interaction of Cu with low‐indexed surfaces of ZnO single crystals as a well‐defined model system was investigated with a broad spectrum of surface science tools. For the polar ZnO surfaces 5–9 and the non‐polar surfaces 10, 11 Cu‐cluster formation is found with the appearance of 3D‐clusters already in the sub‐monolayer range. The structural and the chemical state at the cluster/oxide interface on the other hand are quite unclear.…”
Section: Introductionmentioning
confidence: 94%
“…This oxidation state can be confirmed by the XPS Cu 2p region to differentiate Cu + and Cu 2+ and by the Cu L 3 M 45 M 45 Auger region to differentiate Cu 0 and Cu + . 44,45 …”
Section: Resultsmentioning
confidence: 99%
“…increases with the growth temperature [18][19][20]. Very small surface roughness over large area in all these films makes them suitable for 2D device structure growth on ZnO surface.…”
Section: Morphological Studymentioning
confidence: 97%