2021
DOI: 10.1016/j.apsusc.2021.151170
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Thermal and mechanical limitations to processing resolution in volume non-diffractive ultrafast laser structuring

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Cited by 8 publications
(4 citation statements)
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“…One reason for this phenomenon is that the peak intensity of the 6 ps pulse is lower than the 4 ps pulse at the same pulse energy (19 μJ). Since at 1030 nm the maximum peak intensity is achieved at the pulse duration of 1.5 ps around [38].…”
Section: Resultsmentioning
confidence: 97%
“…One reason for this phenomenon is that the peak intensity of the 6 ps pulse is lower than the 4 ps pulse at the same pulse energy (19 μJ). Since at 1030 nm the maximum peak intensity is achieved at the pulse duration of 1.5 ps around [38].…”
Section: Resultsmentioning
confidence: 97%
“…The observed feature scales are related to practical limitations, for example, the strength of confinement of the evanescent field in the presence of dephasing electronic excitation or the quenching time freezing the material evolution. Besides single feature dimensions, in many cases, the process resolution and the close-packing of the structures on the same scale relate to intrinsic artifacts associated to thermomechanics in the form of mechanically affected regions around the features of interest (Zhang et al, 2021). Part of energy diffuses away from the interaction region as pressure or heat fronts and creates material constraints that pose limitation to generating new structures in the affected regions.…”
Section: Rearranging Matter Under Lightmentioning
confidence: 99%
“…If the surrounding area presents intrinsic structural defects or if the stress around the energy deposition volume caused by thermal expansion exceeds the fracturing threshold (a positive Poisson coefficient could create for example shear stress with material yielding) [73], cracking occurs, limiting the minimal distance between structural voxels without generating catastrophic fracture connecting the voids. Accurate pulse energy, duration and positioning are required to reduce the affected region to a minimum size and increase the packaging density [72]. Possible control strategies to limit the affected regions are summarized in Fig.…”
Section: Genesis Of Single Nanovoidsmentioning
confidence: 99%
“…(d) Counterpropagating beam interference along the Bessel trace and the formation of nanovoid arrays.Reprinted with permission from[70] ©Wiley. (e) Reconstruction of the void and of the affected regions around the voxel with possible cracking under stress[71,72]. Inset: 2D Compressive stress simulations around a a laser-induced heat source.…”
mentioning
confidence: 99%