Thermal and Electrical Properties of a Suspended Nanoscale Thin Film

Abstract

This paper reports on measurements of in-plane thermal conductivities, electrical conductivities, and Lorentz number of two microfabricated, suspended, nanosized thin films with a thickness of 28 nm. The effect of the film thickness on the in-plane thermal conductivity is examined by measuring other nanofilm samples with a thickness of 40 nm. The experimental results show that the electrical conductivity, resistance-temperature coefficient, and in-plane thermal conductivity of the nanofilms are much smaller than the corresponding bulk values from 77 to 330 K. However, the Lorentz number of the nanofilms is about two times that of the bulk value at room temperature, and even up to three times that of the bulk value at 77 K. These results indicate that the relation between the thermal conductivity and electrical conductivity of the nanofilms does not follow the Wiedemann-Franz law for bulk metallic materials.

Evaluating the Resistivity-Temperature Relationship for RTDs and Other Conductors

“…It has been shown that many material properties such as electrical, optical, and thermodynamic are affected if a material's dimensions are reduced to the nanoscale [25]- [29]. Also, experimental evidence has recently shown that the electrical resistance of thin-film conductors in general or thin-film platinum RTDs in particular do not behave exactly as bulk materials [30]- [33]. Since it is well known that the mean free path of electrons in nanosized materials is smaller compared to electrons in bulk materials [34]- [36], care must be taken if the expression in (6) is used to determine the electrical resistivity of conductors when they are not in bulk form.…”

3D Nanofabrication of fluidic components by corner lithography

“…In Figure 4.7, as expected, the electrical resistance increases with increasing the heating current from 11 to 18 mA. At a current of 18 mA, we estimate the maximum temperature to be [390 K], based on the temperature coefficient of thin film gold (0.0017 K −1 (Zhang et al, 2007)). Above 18 mA we suspect that electromigration occurs.…”

Optical absorptance measurement of an individual multiwall carbon nanotube using a T type thermal probe method

“…16. The CNTs were made by an arc-discharge evaporation method and an individual multiwall CNT with a high quality and an available length was selected and fixed to the nanotip of a metallic needle by using local focused electron beam irradiation with the help of a manipulation SEM.…”