Theory of the Use of More Than Two Successive X-Ray Crystal Reflections to Obtain Increased Resolving Power

DuMond, Jesse W. M.

doi:10.1103/physrev.52.872

Cited by 266 publications

(101 citation statements)

References 12 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The second configuration is shown at right in Figure. The principle of the method used to determine horizontal source size is illustrated in Figure 2. where the Dumond diagram [4] explains the collimation effect. In the anti-parallel crystal arrangement x-rays diffract in a very narrow wavelength band over an angular range determined by the overlap of Darwin widths for the two reflections.…”

Section: Experimental Methodsmentioning

confidence: 99%

“Crystal Collimator” Measurement of CESR particle-beam Source Size

Finkelstein¹

2004

AIP Conference Proceedings

View full text Add to dashboard Cite

Abstract. We have measured electron and positron beam source size at CHESS when the Cornell Electron Storage Ring (CESR) is run dedicated for the production of synchrotron radiation. Horizontal source size at several beamlines is expected to shrink by a factor of two but synchrotron (visible) light measurements only provide the vertical size. Therefore a "crystal collimator" using two Bragg reflection in dispersive (+,+) orientation has been built to image the horizontal (vertical) source by passing x-rays parallel to within 5 microradians to an imaging screen and camera. With the "crystal collimator" we observe rms sizes of 1.2 mm horizontal by 0.28 mm vertical, in good agreement with the 1.27 mm size calculated from lattice functions, and 0.26 mm observed using a synchrotron light interferometer.

show abstract

Section: Experimental Methodsmentioning

confidence: 99%

“Crystal Collimator” Measurement of CESR particle-beam Source Size

Finkelstein¹

2004

AIP Conference Proceedings

View full text Add to dashboard Cite

show abstract

“…(34) is simply the angle-wavelength dispersion introduced to the beam by the first DCM crystal. If A 1 and A 2 are neglected, then the relationships among the remaining three variables a, b, and dk for X-rays transmitted through the crossed monochromator/analyzer setup in this simple linear approximation may be understood graphically by an extension of the DuMond diagram (DuMond, 1937) to three dimensions. The ordinary DuMond diagram is simply a graph of Bragg's Law (wavelength or photon energy versus incidence angle) over a very small angular range in which the wavelength (photon energy) variation may be treated as essentially linear.…”

Section: -6mentioning

confidence: 99%

Theoretical analysis of the background intensity distribution in X-ray Birefringence Imaging using synchrotron bending-magnet radiation

Sutter

Dolbnya

Collins

et al. 2015

Journal of Applied Physics

View full text Add to dashboard Cite

In the recently developed technique of X-ray Birefringence Imaging, molecular orientational order in anisotropic materials is studied by exploiting the birefringence of linearly polarized X-rays with energy close to an absorption edge of an element in the material. In the experimental setup, a vertically deflecting high-resolution double-crystal monochromator is used upstream from the sample to select the appropriate photon energy, and a horizontally deflecting X-ray polarization analyzer, consisting of a perfect single crystal with a Bragg reflection at Bragg angle of approximately 45 , is placed downstream from the sample to measure the resulting rotation of the X-ray polarization. However, if the experiment is performed on a synchrotron bending-magnet beamline, then the elliptical polarization of the X-rays out of the electron orbit plane affects the shape of the output beam. Also, because the monochromator introduces a correlation between vertical position and photon energy to the X-ray beam, the polarization analyzer does not select the entire beam, but instead selects a diagonal stripe, the slope of which depends on the Bragg angles of the monochromator and the polarization analyzer. In the present work, the final background intensity distribution is calculated analytically because the phase space sampling methods normally used in ray traces are too inefficient for this setup. X-ray Birefringence Imaging data measured at the Diamond Light Source beamline B16 agree well with the theory developed here.

show abstract

“…By tuning them to maximum flux throughput at the desired energy the higher harmonic reflections are automatically detuned and therefore strongly suppressed. This can be visualized by the so-called DuMond diagram (DuMond, 1937) which has been drawn in Fig. 3 according to the P08 set-up.…”

Section: Opticsmentioning

confidence: 99%

The high-resolution diffraction beamline P08 at PETRA III

Seeck¹,

Deiter²,

Pflaum³

et al. 2011

J Synchrotron Rad

122

102

View full text Add to dashboard Cite

The new third-generation synchrotron radiation source PETRA III located at the Deutsches Elektronen-Synchrotron DESY in Hamburg, Germany, has been operational since the second half of 2009. PETRA III is designed to deliver hard X-ray beams with very high brilliance. As one of the first beamlines of PETRA III the high-resolution diffraction beamline P08 is fully operational. P08 is specialized in X-ray scattering and diffraction experiments on solids and liquids where extreme high resolution in reciprocal space is required. The resolving power results in the high-quality PETRA III beam and unique optical elements such as a large-offset monochromator and beryllium lens changers. A highprecision six-circle diffractometer for solid samples and a specially designed liquid diffractometer are installed in the experimental hutch. Regular users have been accepted since summer 2010.

show abstract

Theory of the Use of More Than Two Successive X-Ray Crystal Reflections to Obtain Increased Resolving Power

Cited by 266 publications

References 12 publications

“Crystal Collimator” Measurement of CESR particle-beam Source Size

“Crystal Collimator” Measurement of CESR particle-beam Source Size

Theoretical analysis of the background intensity distribution in X-ray Birefringence Imaging using synchrotron bending-magnet radiation

The high-resolution diffraction beamline P08 at PETRA III

Contact Info

Product

Resources

About