Theoretical study of the KLL dielectronic recombination for highly charged iodine ions

Shi, Yu-Ren; Dong, Chenzhong; Zhang, D.H.

doi:10.1016/j.physleta.2008.02.089

Physics Letters A

2008

DOI: 10.1016/j.physleta.2008.02.089

|View full text |Cite

Theoretical study of the KLL dielectronic recombination for highly charged iodine ions

Yu-Ren Shi

Chenzhong Dong

D.H. Zhang

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2010

2019

Publication Types

Select...

Article6

Relationship

Self Cite0

Independent6

Authors

Journals

Cited by 13 publications

(24 citation statements)

References 24 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…This means reliable DR strengths can still be obtained by leaky mode ion extraction in most cases if proper corrections are applied. As an illustration, the experimental results in [26] were corrected using the difference of the intensity ratios calculated in this work, the results agree very well with the theoretical results of [28]. …”

supporting

confidence: 78%

“…These calculations were based on the multiconfiguration Dirac Fock method and included proper accounts of quantum electrodynamics (QED) and the Breit interaction. The work in [28] shows a systematic disagreement with the experimental results from [26], but are in agreement with calculations using the Flexible Atomic Code (FAC) by Yao et al [23]. This fact leads us to reconsider the validity of the assumption which supports the continuous or leaky extraction method for DR strength experiments at EBIT and EBIS.…”

supporting

confidence: 68%

“…We tried to normalize the experimental relative intensities in [26] to the corresponding ratios of Table I, and used the new relative intensities to correct the resonant strengths in [26]. The corrected resonant strengths are in excellent agreement with the calculations in [28]. The results are shown in Fig.…”

mentioning

confidence: 65%

“…Recently there was a publication [28] describing careful calculations for DR strengths and resonant energies for He-like to C-like iodine. These calculations were based on the multiconfiguration Dirac Fock method and included proper accounts of quantum electrodynamics (QED) and the Breit interaction.…”

mentioning

confidence: 99%

“…In order to check if the difference between the relative intensities of the extracted ions and the trapped ions persists if the experimental conditions are changed, we expressed the ratio of the relative intensity of the extracted ions over that of the trapped ions as follows: [26], from the theoretical work in [28], and from the correction of the experimental results [26] by the ratios of Table I. in which the factor F can be deduced to be…”

mentioning

confidence: 99%

See 4 more Smart Citations

Leaky ion extraction method for dielectronic recombination strength measurements at electron-beam ion traps

et al. 2010

View full text Add to dashboard Cite

There are a number of mechanisms via which ions and electrons interact in a plasma, but by far one of the most important is through dielectronic recombination (DR). This is a resonant process through which an ion can capture a free electron and decrease its charge by one unit. Cross sections or strengths for this process are of vital importance in the modeling of hot plasmas and hence any advance in measurement or calculation procedures for obtaining DR data is of great importance. The work presented here examines the underlying basis of a newly developed method based on leaky mode ion extraction from an electron beam ion trap (EBIT), for relatively quickly obtaining DR strengths. The development attains to use the ratio of the leaked ions in adjacent charge states, i.e., the initial and final charge states of a DR process, to obtain the strengths preassuming that this ratio is the same as that of the ions remaining inside the EBIT trap. This work shows this assumption to be false. Hence DR strengths measured using leaked ions may be subject to error. But this work also reveals that the difference between this ratio and the one for trapped ions is insensitive to most of the experimental conditions, which means reliable DR strengths can still be obtained by leaky mode ion extraction if proper corrections are applied. An example is shown in this paper where after correction of some experimental results for DR strengths, obtained using the leaky mode, excellent agreement with corresponding theoretical calculations is obtained.

show abstract

supporting

confidence: 78%

supporting

confidence: 68%

mentioning

confidence: 65%

mentioning

confidence: 99%

mentioning

confidence: 99%

See 3 more Smart Citations

Leaky ion extraction method for dielectronic recombination strength measurements at electron-beam ion traps

et al. 2010

View full text Add to dashboard Cite

show abstract

Investigation of the intershell higher order resonant recombination and polarization of X‐ray emission of B‐like silicon ions

Xie

Cheng

et al. 2019

X-Ray Spectrometry

View full text Add to dashboard Cite

K‐shell dielectronic, trielectronic, and quadruelectronic recombination and polarization of X‐ray emission have been studied for the highly charged Si9+ ions in the initial ground state 2P1/2 and the metastable state 2P3/2 using the Flexible Atomic Code. It is found that the resonant recombination cross section from the long‐lived metastable state is comparable in magnitude with that of the ground state, so it is important for plasma diagnostics. For Si9+(2P1/2), trielectronic recombination contributions of nearly 25% to the total resonant recombination strength are predicted, which is less than previous calculations. We compare the degree of linear polarization for the eleven dominant resonant recombination satellite lines from the initial parent Si9+(2P1/2) and Si9+(2P3/2) ions. For the same X‐ray lines, large variations of polarization are found between 2P1/2 and 2P3/2, which can be employed to diagnose formation mechanisms of intermediate resonance states and corresponding X‐ray lines.

show abstract

KLL dielectronic recombination resonant strengths of He-like up to O-like tungsten ions

Xiao

Shen

et al. 2016

Physics of Plasmas

View full text Add to dashboard Cite

Dielectronic recombination (DR) is an important process in hot plasma physics as well as in atomic structure and collision theory. This work reports the studies of the KLL DR resonance strengths of He-, Li-, Be-, B-, C-, N-, and O-like tungsten ions, through both experiment and calculation. The experimental resonance strengths were determined within uncertainty below 11% at the Shanghai electron beam ion trap by employing a fast electron beam-energy scanning technique. A fully relativistic configuration interaction method implemented in the flexible atomic code was employed to calculate DR process and also radiative recombination (RR). The consideration of the interference effect between DR and RR was revealed to be necessary to determine the resonance strength.

show abstract

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

hi@scite.ai

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Theoretical study of the KLL dielectronic recombination for highly charged iodine ions

Cited by 13 publications

References 24 publications

Leaky ion extraction method for dielectronic recombination strength measurements at electron-beam ion traps

Leaky ion extraction method for dielectronic recombination strength measurements at electron-beam ion traps

Investigation of the intershell higher order resonant recombination and polarization of X‐ray emission of B‐like silicon ions

KLL dielectronic recombination resonant strengths of He-like up to O-like tungsten ions

Contact Info

Product

Resources

About