Theoretical simulation and preparation of binary and ternary combinatorial libraries by thermal PVD

Klemm, Sebasian Oliver; Martin, Alistair; Lengsfeld, Julia; Schauer, Janine-Christina; Schuhmacher, Bernd; Hassel, Achim Walter

doi:10.1002/pssa.200983302

Cited by 16 publications

(6 citation statements)

References 31 publications

(31 reference statements)

Supporting

Mentioning

Contrasting

Order By: Relevance

“…This is due to the geometry of the co‐deposition setup (Fig. ) combined with the cos ‐law for the thickness variation along the substrate during thermal evaporation . Weak gradients were measured also in the concentration of both Mg and Zn along the sample.…”

Section: Resultsmentioning

confidence: 96%

Synthesis and characterization of Al–Mg–Zn thin film alloys co‐deposited from vapour phase

Voith

Mardare

Hassel

2013

Physica Status Solidi (a)

Self Cite

View full text Add to dashboard Cite

732 2468 8905 Web: www.jku.at/ictas Mg-Zn thin film alloys were produced by thermal co-evaporation using single source and dual source geometries. The films containing high amount of Zn (66 at.%) were prone to formation of metallic micro spheres on the surface when high evaporation rates (10 nm s À1 ) were used. The Mg-27.1 at.% Zn bulk alloy was found to be suitable for co-deposition with Al for producing Al-Mg-Zn thin film alloys. A low Al concentration gradient (5 at.%) could be obtained along the sample due to the high deposition rates of Mg-Zn (7.5 nm s À1 ) combined with low Al deposition rates (0.2 nm s À1 ). The Al-Mg-Zn thin films showed an improved resistance against chemical attack when higher amounts of Al are used, as shown by downstream analytics investigations using a flat flow electrochemical cell coupled to an AAS system.

show abstract

Section: Resultsmentioning

confidence: 96%

Synthesis and characterization of Al–Mg–Zn thin film alloys co‐deposited from vapour phase

Voith

Mardare

Hassel

2013

Physica Status Solidi (a)

Self Cite

View full text Add to dashboard Cite

show abstract

“…This produced a thickness gradient along the length of the sample due to the Knudsen cosine law of evaporation, which in the present study had a measured cosine exponent of 3.5. [30] This thickness gradient was prepared intentionally. Neither aluminium nor its oxide are photoactive, thus the thin metal film is reflecting part of the light and the thickness gradient results in a light intensity gradient that can be detected by the PE-SDCM.…”

Section: Resultsmentioning

confidence: 99%

Photoelectrochemical Scanning Droplet Cell Microscopy (PE‐SDCM)

2013

Self Cite

View full text Add to dashboard Cite

Principles of localised photoelectrochemistry are summarised and an experimental approach is described that allows the performance of the most important photoelectrochemical experiments within a diameter of 100 μm. Various light sources, such as a continuum emitter with a monochromator, LEDs, and lasers are coupled into a multi-mode fibre to illuminate a small spot that is wetted by the electrolyte from a capillary. Reference electrode, counter electrode, and optical fibre are installed in the capillary system. The performance of this system is demonstrated by photocurrent measurements on n-doped Si and p-doped Si as model substrates. A thickness-graded aluminium thin film for partial shadowing on Si proves the applicability for material library investigations in combinatorial materials science. Further experiments demonstrate the possibility of electrical light chopping as well as impedance spectroscopy with subsequent Mott-Schottky analysis for the determination of charge-carrier concentration and type, flat-band potential, and inversion layer formation. Photoelectrochemical scanning droplet cell microscopy (PE-SDCM) is an extremely versatile tool for the screening of water splitting photoelectrodes, the characterisation of photocatalysts, and high throughput characterisation of microgram amounts of new solar cell materials.

show abstract

“…Generally, in any co‐deposition from vapour phase a compositional gradient is expected to be found on the substrate surface. This is due to the cosine law governing the thickness distribution across the substrate. When two or more materials are simultaneously sputtered from different targets, each material may in principle produce its own thickness distribution.…”

Section: Resultsmentioning

confidence: 99%

Copper–zinc thin films reactively co‐sputtered from a two‐component sectioned cathode

Burgstaller

Mardare

Hassel

2013

Physica Status Solidi (a)

Self Cite

View full text Add to dashboard Cite

Cu-Zn thin film oxide alloys have been fabricated by reactive co-sputter deposition using a sectioned two-component metallic target. A Cu-Zn compositional spread ranging from Cu-88 at.% Zn to Cu-1.3 at.% Zn defining a combinatorial library was identified. A thickness gradient with a maximum of 4.1 mm was found. The microstructure of the Cu-Zn oxide thin films was analyzed by SEM, finding three compositional zones with structural differences. XRD investigations have revealed different crystalline structures for each of the three zones. CuZn intermetallics and pure Cu-phase were identified together with Cu 2 O and ZnO. For the first compositional zone XPS depth profiles have shown metallic phase segregation at the thin film/substrate interface. At Zn concentrations higher than 45 at.% Zn an increased tendency of ZnO formation was identified.

show abstract

Theoretical simulation and preparation of binary and ternary combinatorial libraries by thermal PVD

Cited by 16 publications

References 31 publications

Synthesis and characterization of Al–Mg–Zn thin film alloys co‐deposited from vapour phase

Synthesis and characterization of Al–Mg–Zn thin film alloys co‐deposited from vapour phase

Photoelectrochemical Scanning Droplet Cell Microscopy (PE‐SDCM)

Copper–zinc thin films reactively co‐sputtered from a two‐component sectioned cathode

Contact Info

Product

Resources

About