Theoretical and Experimental Uncertainty in Temperature Measurement of Materials by Raman Spectroscopy

LaPlant, Fred; Laurence, George; Ben‐Amotz, Dor

doi:10.1366/0003702963905321

Cited by 40 publications

(32 citation statements)

References 11 publications

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“…148 This process is generally only suitable for high combustion temperatures due to the relative weakness of the anti-Stokes signal. 149 The uncertainties in temperature measurement utilizing Raman spectroscopy were discussed by Laplant et al 150 Figure 13 …”

Section: E Spontaneous Rayleigh and Raman Scatteringmentioning

confidence: 99%

Review of temperature measurement

Childs

Greenwood

Long

2000

Review of Scientific Instruments

779

442

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Section: E Spontaneous Rayleigh and Raman Scatteringmentioning

confidence: 99%

Review of temperature measurement

Childs

Greenwood

Long

2000

Review of Scientific Instruments

779

442

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“…Temperature accuracy of the measurements can vary between 5-20K depending on the Raman spectral resolution, background and optics [18,19]. For practical absolute temperature measurement, it is necessary to calibrate the Raman spectrum prior to the experiment.…”

Section: Raman Measurementsmentioning

confidence: 99%

Microscale and Nanoscale Thermal Characterization Techniques

Christofferson

Maize

Ezzahri

et al. 2007

2007 International Conference on Thermal Issues in Emerging Technologies: Theory and Application

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Miniaturization of electronic and optoelectronic devices and circuits and increasedswitching speeds have exasperated localized heating problems. Steady-state and transient characterization of temperature distribution in devices and interconnects is important for performance and reliability analysis. Novel devices based on nanowires, carbon nanotubes and single molecules have feature sizes in 1-100nm range and precise temperature measurement and calibration are particularly challenging. In this paper we review various microscale and nanoscale thermal characterization techniques that could be applied to active and passive devices. Solid-state micro refrigerators on a chip can provide a uniform and localized temperature profile and they are used as a test vehicle in order to compare the resolution limits of various microscale techniques. After a brief introduction to conventional micro thermocouples and thermistor sensors, various contact and contactless techniques will be reviewed. Infrared microscopy is based on thermal emission and it is a convenient technique that could be used with features tens of microns in size. Resolution limits due to low emissivity and transparency of various materials and issues related to background radiation will be discussed. Liquid crystals that change color due to phase transition have been widely used for hot spot identification in integrated circuit chips. The main problems are related to calibration and aging of the material. Micro Raman is an optical method that can be used to measure absolute temperature. Micron spatial resolution with several degrees temperature resolution has been achieved. Thermoreflectance technique is based on the change of the sample reflection coefficient as a function of temperature. This small change in 10 -4 -10 -5 range per degree is typically detected using lock-in technique when the temperature of the device is cycled. Use of visible and near IR wavelength allows both top surface and through the substrate measurement. Both single point measurements using a scanning laser and imaging with CCD or specialized lock-in cameras have been demonstrated. For ultrafast thermal decay measurement, pump-probe technique using nanosecond or femtosecond lasers have been demonstrated. This is typically used to measure thin film thermal diffusivity and thermal interface resistance. The spatial resolution of various optical techniques can be improved with the use of tapered fibers and near field scanning microscopy. While sub diffraction limit structures have been detected, strong attenuation of the signal reducesthe temperature resolution significantly. Scanning thermal microscopy which is based on nanoscale thermocouples at the tip of atomic force microscope has had success in ultra high spatial resolution thermal mapping. Issues related to thermal resistance between the tip and the sample and parasitic heat transfer paths will be discussed.

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“…The data is seen to fit reasonably well with an exponential trend (consistent with the exponential attenuation of the signal in the sensing fiber). For a SNR improvement of 10 dB, we expect to see a 3 times reduction in the RMS temperature error since it is inversely proportional to √SNR [9]. The data obtained shows a slightly lower number (2.5 times), probably due an uniform error observed across the entire length of fiber.…”

Section: Resultsmentioning

confidence: 84%

Performance enhancement of Raman optical time domain reflectometer using Golay codes

2010

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We show the performance enhancement of a distributed temperature sensing system based on Raman scattering in optical fibers by using correlation codes. Specifically, we demonstrate experimentally that the use of Golay sequences provide an improvement in the signal to noise ratio by a factor of 10 dB, thereby providing an improvement in the temperature uncertainty by a factor of 2.5 over conventional technique.

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Theoretical and Experimental Uncertainty in Temperature Measurement of Materials by Raman Spectroscopy

Cited by 40 publications

References 11 publications

Review of temperature measurement

Review of temperature measurement

Microscale and Nanoscale Thermal Characterization Techniques

Performance enhancement of Raman optical time domain reflectometer using Golay codes

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