2001
DOI: 10.1016/s0927-0248(00)00266-x
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Theoretical analysis of the effect of conduction band offset of window/CIS layers on performance of CIS solar cells using device simulation

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Cited by 585 publications
(466 citation statements)
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“…S1a). 15 If the conduction band energy of the buffer layer is too high compared to that of the absorber layer, the positive CBO at the buffer/absorber interface creates a barrier that prevents electrons from flowing across the junction towards the transparent conducting oxide (TCO) layer ( Although it has been demonstrated that low electron carrier concentration of Zn(O,S) can improve SnS-based solar cells, this can increase contact resistance with the TCO layer by adding series resistance to the solar cell, which reduces the short-circuit current density (J SC ). While a low carrier concentration of Zn(O,S) can be beneficial for the portion of the buffer layer closer to the absorber layer to reduce possible recombination occurring at the absorber/buffer interface, a high carrier concentration of Zn(O,S) can be beneficial for the portion of the buffer layer closer to the TCO layer to reduce contact resistance.…”
Section: Introductionmentioning
confidence: 99%
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“…S1a). 15 If the conduction band energy of the buffer layer is too high compared to that of the absorber layer, the positive CBO at the buffer/absorber interface creates a barrier that prevents electrons from flowing across the junction towards the transparent conducting oxide (TCO) layer ( Although it has been demonstrated that low electron carrier concentration of Zn(O,S) can improve SnS-based solar cells, this can increase contact resistance with the TCO layer by adding series resistance to the solar cell, which reduces the short-circuit current density (J SC ). While a low carrier concentration of Zn(O,S) can be beneficial for the portion of the buffer layer closer to the absorber layer to reduce possible recombination occurring at the absorber/buffer interface, a high carrier concentration of Zn(O,S) can be beneficial for the portion of the buffer layer closer to the TCO layer to reduce contact resistance.…”
Section: Introductionmentioning
confidence: 99%
“…S1a). 15 If the conduction band energy of the buffer layer is too high compared to that of the absorber layer, the positive CBO at the buffer/absorber interface creates a barrier that prevents electrons from flowing across the junction towards the transparent conducting oxide (TCO) layer (Fig. S1b).…”
mentioning
confidence: 99%
“…20 According to device simulations, a large negative CBO gives rise to an increase in the interface recombination, while a large positive CBO greater than +0.5 eV creates a barrier in the conduction band that impedes the collection of photo-generated electron. 21,22 Thus, a small positive CBO is desirable to reduce interface recombination without any loss in photo-current collection. 21,22 One of the approaches to adjust the CBO is to vary the constituent elements in the semiconductor-alloy buffer layer.…”
mentioning
confidence: 99%
“…21,22 Thus, a small positive CBO is desirable to reduce interface recombination without any loss in photo-current collection. 21,22 One of the approaches to adjust the CBO is to vary the constituent elements in the semiconductor-alloy buffer layer. For example, (Zn,Cd)S, 23 (Zn,Mg)O, 24 (Zn,Sn)O x , 25 and Zn(O,S) 26 were used in an attempt to replace CdS in CIGS solar cells.…”
mentioning
confidence: 99%
“…Indeed the average electrostatic potential we use demonstrates such character, validating that it provides the proper theoretical reference linking microscopic interface modelling with macroscopic screening in semiconductor interfaces. Strikingly, our calculations show that for the perfect interface the CBO = 0.83 eV, which is far from optimal, where 0-0.4 eV, 63 is thought to be best. Such a high CBO would provide a barrier preventing transport of photo-generated electrons from absorber to buffer layer.…”
Section: Resultsmentioning
confidence: 73%